
X-ray Photoelectron Spectroscopy (XPS) Reference Pages: Tin
X-ray photoelectron spectroscopy (XPS or ESCA) curve fitting procedures, reference materials and useful notes are listed here to provide a starting point for the consistent interpretation of XPS spectra.
XPS spectra of Sn surface: (a) survey scan; high resolution XPS …
The presence of Sn, O, and C elements was confirmed in the XPS data, as shown in Figure 3a, with high-resolution XPS spectra for Sn 3d 3/2 and Sn 3d 5/2 ( Figure 3b).
P 2p, P 2s high-resolution XPS spectra of CoP 3 and the …
We use the sum of the ionization and Auger energy, the so-called Auger parameter, measured from the x-ray photoelectron spectrum, to study the valence electron distribution in the skutterudite...
Sn 3d 奇怪的XPS峰 - 催化 - 小木虫 - 学术 科研 互动社区
做了一个SnO2:Mn薄膜的XPS数据,O和Mn的峰都没啥问题,但是感觉Sn的峰很奇怪,其中两个最主要的峰应该是Sn3d 1/2和Sn 3d 3/2的峰,但是这两个旁边怎么还有个小峰呢。
Table 1 . XPS peak positions of the different Sn 3d peaks.
An x-ray photoemission spectroscopy (XPS) analysis of chemical composition revealed the presence of both Sn2+ and Sn4+ species in layers with and without post-drying annealing step.
锡 | Thermo Fisher Scientific - CN
以外来 C1s 谱峰 (284.8 eV) 作为基准进行氧化物荷电校正。 • 采集 XPS 价带谱,以区分 SnO 和 SnO2。 Sn3d 区域具有明显的自旋轨道分裂峰 (Δ 金属 =8.4 eV)。 金属峰的峰形不对称。 观察到锡金属的 3d 3/2 自旋轨道分裂峰的高结合能侧有能量损失特征谱。 SnO 和 SnO 2 的结合能相似。 使用 XPS 价带谱来区分这些氧化物。 根据考古证据,据信人们使用锡的历史至少有5500年,使其成为最早已知的金属之一。 锡在地壳中的含量很小,约0.001%。 锡从矿物锡石中提取而得。 …
Tin Spectra – SnS – The International XPS Database 1
The XPS Spectra section provides raw and processed survey spectra, chemical state spectra, BE values, FWHM values, and overlays of key spectra. Atom% values from surveys are based on sample, as received, and Scofield cross-sections. Atom% values are corrected for IMFP and PE. Peak-fits are guides for practical, real-world applications.
X-ray photoemission spectroscopy (XPS) analysis on platinum …
The XPS spectrum showed the Sn 4d, Sn 4p, Sn 4s, C 1s, Sn 3d3/2, O 1s, Sn 3p1/2 and Sn 3s peaks. The high resolutions scan revealed that the 0 1s has a binding energy of 530.2 eV which indicates that there were oxygen vacancies in the doped material.
X-ray Photoelectron Spectroscopy (XPS) Reference Pages
X-ray photoelectron spectroscopy (XPS or ESCA) curve fitting procedures, reference materials and useful notes are listed here to provide a starting point for the consistent interpretation of XPS spectra. These reference pages contain tips and techniques that are designed to help both the novice and advanced XPS user.
Tin (Sn), Z=50 - The International XPS Database 1
Sn (3d5/2) Chemical State BEs from: “The XPS Library Spectra-Base” Charge Referencing Notes. (N*number) identifies the number of NIST BEs that were averaged to produce the BE in the middle column. The XPS Library uses Binding Energy Scale Calibration with Cu (2p3/2) BE = 932.62 eV and Au (4f7/2) BE = 83.98 eV. BE (eV) Uncertainty Range: +/- 0.2 eV.
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