2015年3月5日 · XPS has been used to analyze composition and chemical states of the components in the samples. The XPS survey spectrum (Fig. 7 a) of the SeO 2 /TiO 2 indicates the peaks of elements Ti, Se, O, and C. Fig. 7 b–d shows …

2017年10月31日 · The superficial and total SeO 2 mass fractions were measured by X-ray photoelectron spectroscopy (XPS) and inductively coupled plasma atomic emission spectroscopy (ICP-AES), respectively. The surface valence state and bulk structure are determined by XPS and X-Ray Diffraction (XRD).

1986年1月1日 · X-ray photoelectron spectroscopy (XPS) of the Se 3d peak for Se in Se, SeO 2, As 2 Se 3, ZnSe, CdSe, CoSe, FeSe, CrSe, VSe 2 and TiSe were studied.

The Basic XPS Information Section provides fundamental XPS spectra, BE values, FWHM values, BE tables, overlays of key spectra, histograms and a table of XPS parameters. The Advanced XPS Information Section is a collection of additional spectra, overlays of spectra, peak-fit advice, data collection guidance, material info,

Microstructure evolution of ceria-based mixed oxides CeO2-MO2 (M ) Si4+, Ti4+, and Zr4+) after thermal treatments in the temperature range of 773-1073 K were investigated by X-ray diffraction...

摘要 研究了Se、SeO 2 、As 2 Se 3 、ZnSe、CdSe、CoSe、FeSe、CrSe、VSe 2 和TiSe中Se 3 d峰的X射线光电子能谱 (XPS)。 发现，首先，在 As 2 Se 3 、ZnSe、CdSe、CoSe 和 CrSe 的情况下，随着阴离子电负性变化的增加，Se 3 d 峰的结合能值的变化也增加，并且其次，在所有研究的 Se 化合物中，纯 Se 中的 Se-Se 键强于 Se-x 键，其中 x = As、Zn、Cd、Co、Fe、Cr、V 和 Ti。 摘要 研究了Se、SeO 2 、As 2 Se 3 、ZnSe、CdSe、CoSe、FeSe、CrSe、VSe 2 …

2023年9月4日 · XPS 谱图显示，SeO2 在交流表面上的分解和还原行为促进了 Se0 形式的硒的存在。 DFT 计算表明，SeO2 化学吸附在交流电的典型扶手椅和锯齿形表面上，最稳定结构的吸附能分别为 -89.77 和 -235.12 kcal/mol。

XPS spectra displaying the Se 3d and O 1s regions of the lms treated at each temperature are presented in Fig. 3 and 4 respectively. XPS spectra for the Zn 2p regions can be found in the ESI Fig....

2023年2月18日 · 从图7中根据XPS谱图中特征峰位置可以看出MgO吸附产物中的Se主要以SeO 3 2-与SeO 2 存在。尽管MgO的比表面积相比于CaO更大，但MgO对Se的吸附能力远低于CaO，这可能与Ca、Mg的电负性有关。

Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) coupled with elemental mapping were used to characterize the morphologies of the products. The micro-nanostructures were recorded using HRTEM. X-ray photoelectron spectroscopy (XPS) was performed on a Kratos Analytical AXIS Supra system.