2018年4月1日 · The XRD spectra and micro-Raman spectra indicate that the core is high degree of crystallinity and phase purity in annealed fibers. Therefore, Se 0.5 Te 0.5 crystals were precipitated in core region by a postdrawing annealing process.

2016年7月1日 · This paper describes the preparation of multi-walled carbon nanotube chalcogenide glasses alloys [ (Se 80 Te 20) 100-x (CNT) x] (x = 2 and 10) by melt quenching technique and were characterized with XRD, SEM, Raman, electrical and dielectric measurements. An XRD measurement reveals the amorphous nature of the prepared samples.

2023年2月18日 · In this work, we introduce a new class of PCMs based on Sb-rich germanium equichalcogenides (containing equal amount of S, Se and Te) with total content of chalcogen atoms less than 50 at%.

2010年8月6日 · The XRD pattern for Ag 2 Se x Te 1−x were obtained for different thicknesses of 50, 150, 230 nm respectively (Fig. 1). It is observed that majority of the peaks corresponded to both Ag 2 Se and Ag 2 Te respectively. The XRD peaks were found along with amorphous background for thicknesses 50 and 150 nm.

2016年7月1日 · 摘要 本文介绍了采用熔融淬火技术制备多壁碳纳米管硫属化物玻璃合金 [(Se80Te20)100-x(CNT)x] (x = 2 和 10)，并用 XRD、SEM、拉曼、电学和介电测量。 XRD 测量揭示了所制备样品的无定形性质。

2020年2月25日 · Here, thermally evapo-rated SexTe1-x alloy thin films with tunable bandgaps for the fabrication of high-performance SWIR photodetectors are reported. From absorption measurements, it is shown that the bandgaps of SexTe1-x films can be tuned continuously from 0.31 eV (Te) to 1.87 eV (Se).

2022年6月18日 · Based on the TE process, a novel spatial extrusion–twist–extrusion (SETE) SPD process, which can provide greater equivalent strain (or plastic deformation), is proposed to modify the surface radiation damage morphology of RAFM steel.

Left-top inset shows the XRD of the Sb 2 SeTe 2. The sharp peaks indicate the high crystallinity of the Sb 2 SeTe 2 crystal. The right-bottom inset shows a SEM picture of the Sb 2 SeTe 2...

An XRD measurement reveals the amorphous nature of the prepared samples. The SEM and Raman study confirm the presence of CNT in SeTe alloy. The diffused prime Raman bands (G and D) have been appeared for MWCNT/SeTe glassy alloy. The current versus voltage (I V) characteristics and DC conductivity measurement were carried out.

TSeTe thin films are fabricated by using the thermal evaporation technique. In order to determine the structural and morphological properties of these films, XRD (X-ray diffraction), SEM (Scanning electron microscopy), EDXA (Energy dispersive X-Ray analysis), Raman Analysis, and AFM (Atomic Force Microscopy) measurements are carried out.