X-ray photoelectron spectroscopy studies of indium tin oxide ...
2005年1月1日 · SEM and energy dispersive X-ray spectrometry (EDX) provides 3-D images and bulk chemical composition (Sn/In ratio) of the ITO powders. By use of TEM, primary particle sizes were measured, and the particle size distribution was determined.
XPS spectra of (a) full spectrum, (b) Sn3d and (c) O1s.
The high-resolution deconvoluted XPS spectra for Sn3d are shown in Fig. 6(b). Two Sn 4+ peaks with binding energies of 487.11 (Sn3d5/2) and 495.19 eV (Sn3d3/2) are observed.
XRD and XPS of Cd2SnO4 Thin Films Obtained by Spray Pyrolysis
2016年1月8日 · Cd2SnO4 thin films with a 1:1 and 1:3 Sn/Cd weight ratio at different substrate temperatures were fabricated by spray pyrolysis. The structural and surface composition of these films by X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) were...
XPS spectra of solders after PVC fire smoke corrosion test: a Sn3p, …
Sn21Cl16 (OH)14O6 with SnO and SnO2 are detected as the main corrosion products of SAC305 solder by EDS, XRD and XPS analysis. While the corrosion products of Sn–37Pb solder are Sn21Cl16 (OH)14O6...
Table 1 . XPS peak positions of the different Sn 3d peaks.
An x-ray photoemission spectroscopy (XPS) analysis of chemical composition revealed the presence of both Sn2+ and Sn4+ species in layers with and without post-drying annealing step.
锡 | Thermo Fisher Scientific - CN
• 采集 XPS 价带谱，以区分 SnO 和 SnO2。 XPS 光谱解读. Sn3d 区域具有明显的自旋轨道分裂峰 (Δ 金属 =8.4 eV)。 金属峰的峰形不对称。 观察到锡金属的 3d 3/2 自旋轨道分裂峰的高结合能侧有能量损失特征谱。 SnO 和 SnO 2 的结合能相似。 使用 XPS 价带谱来区分这些氧化 ...
一种表征材料表面元素分布的XPS成像分析方法与流程
本专利提供了一种表征材料表面元素及不同价态元素分布的XPS成像分析方法，通过逐点对材料表面元素采集光电子能谱得到，通过对每个点采集得到的元素窄谱进行细致的数据处理，可以得到材料表面元素及元素的不同价态分布情况。 技术实现要素： 本发明目的在于提供了一种表征材料表面元素分布的XPS成像分析方法，解决了目前采用技术不能定义本底位置的问题。 实现了在定义本底位置的同时通过细致图谱拟合，得到材料的表面信息，提供直观准确的参考数据。 一种表 …
有机锡化合物的光电子能谱_XPS_和质谱_MS_研究_ - 豆丁网
2013年12月25日 · 文通过xps研究方法对7种新合成的有机锡化合物的锡、氧以及卤素的内层电子结合能的化 学位移以及他们之间的关系进行了讨论;同时根据MS数据讨论了化学键的断裂及其与XPS
Structural, optical, magnetic, and XPS properties of ... - ScienceDirect
2022年4月1日 · Raman studies found the presence of small amounts of Sn 3 O 4 or Sn 2 O 3 phases in the nanoparticles. The presence of oxygen vacancies in the nanoparticles was established by X-ray photoelectron spectroscopy (XPS). Their density increase is probably accompanied by the saturation magnetization enhancement.
Facile surface modification process of Sn-doped In
The structural, surface, optical, and electrical transport properties of surface-modified different Sn-In 2 O 3 thin films deposited on glass substrates were analyzed using GXRD, XPS, FE-SEM, EDS, UV–VIS–NIR, and Hall