Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves.

Company ScanSens manufactures fiber-based SNOM probes for Scanning Near Field Optical Microscopes. SNOM probes can be supplied in different configurations: single aperture fibers and the same fibers, attached to NT-MDT-compatible tuning forks.

Scanning near-field microscopy (SNOM) is a type of scanning probe microscopy technique that measures light-matter interactions at the nanoscale to investigate local optical properties of a sample. It relies on optical near-field effects to push its resolution below the diffraction limit as obtained in conventional far-field measurements.

Probes are produced from standard single-mode Nufern fibers by the method of chemical etching that provides better optical efficiency in comparison with mechanical pulling. Probes perform all current modes of SNOM operation - transmission, reflection and collection. We offer 5 types of transmitted wavelength: MF001 – 400-550 nm; MF002 – 450 ...

扫描近场显微术 (snom) 是一类对纳米尺度下光与物质的相互作用进行测量的扫描探针显微镜技术，可用于研究样品的局域光学特性。 通过运用光学近场效应，它的分辨率突破了传统远场测量中的衍射极限。

2021年6月1日 · In scattering SNOM, a laser is focused onto a metallized atomic force microscope (AFM) probe, which excites a tightly confined near-field (a non-radiative electromagnetic field) at the...

2016年10月17日 · Scattering-type scanning near-field optical microscopy (s-SNOM) allows spectroscopic imaging with spatial resolution below the diffraction limit. With...

Company NT-MDT Spectrum Instruments supply with the SNOM probes for Scanning Near Field Optical Microscopes. SNOM probes with transmitted wavelength 400-550nm, basic Nufern fiber 405-HP, fiber diameter 125 um, fiber length 2m, aperture of 50-90 nm (70±20).

SNOM probes with fiber diameter 125 μm, fiber length 2m, aperture less than 100nm. The probes are prepared by chemical etching method. This method gives the optical efficiency 102 - 104 times better than those obtained by mechanical pulling.

Several mechanisms have been proposed previously to SNOM and related evanescent field techniques, including electron tunneling, capacitance, photon tunneling and near-field reflection. At present the most-used method of probe-sample distance regulation relies on the detection of shear forces between the end of the near-field probe and the ...