2005年6月10日 · The interaction between the (1 0 0) surface of SnTe single crystal and molecular oxygen was studied by means of X-ray photoelectron spectroscopy (XPS). Analysis of the obtained spectra shows that the mechanism of surface oxidation does not change in the range of oxygen exposure 10 8 –10 13 L.

2018年9月15日 · In this work we combine experimental techniques: angle-resolved X-ray photoelectron spectroscopy (ARXPS), Time Of Flight Secondary Ion Mass Spectroscopy (TOF-SIMS) and Raman spectroscopy to determine depth-resolved chemical composition profile of the surface of SnTe crystal subject to air exposure at room temperature over the …

2023年9月5日 · X-ray photoelectron spectroscopy (XPS) was used to study the chemical composition as well as the valence electronic states of the constituent elements. Fig. 5 shows the XPS wide scan spectra of pure SnTe and 4% Ag & Cu …

2023年5月4日 · Here, we report a thiol-free tin telluride (SnTe) precursor that can be thermally decomposed to produce SnTe crystals with sizes ranging from tens to several hundreds of nanometers.

2023年2月14日 · In this work, we report the low-pressure PVD synthesis of high-quality 2D SnSe crystals with thinner thickness and larger lateral sizes. The as-synthesized SnSe displays high crystallinity and phase purity, as confirmed by Raman, X-ray photoemission spectroscopy (XPS), and scanning transmission electron ((micro-scopy)) (STEM).

The XPS technique is a well-known tool for studying the chemical states of the surface elements of a sample. Since our theoretical studies revealed that the efficient electrocatalytic performance of the SnTe (001) sample may come from the specific dilute oxidized structures, we have performed XPS depth-profiling on the SnTe (001) sample to ...

High-resolution XPS scans of Sn 3d and Cl 2p of the Sn-templates, as well as Sn 3d and Te 3d of the SnTe nanosheets are presented in Figure 2. The Sn 3d5/2 peak of Sn-template can be found at a...

2016年12月22日 · We report the determination of band alignment of PbTe/SnTe (111) heterojunction interfaces using X-ray photoelectron spectroscopy (XPS). Multiple core levels of Pb and Sn were utilized to determine the valence band offset (VBO) of the heterojunction.

2017年11月9日 · We, for the first time, provide the experimental demonstration on the band gap engineering of layered hexagonal SnSe 2 nanostructured thin films by varying the thickness. For 50 nm thick film, the...

The dominant oxide species on the surface is TeO 2 for Te-rich films, which is deduced by X-Ray photoelectron spectroscopy (XPS) results. Pure Te TFs yield a work function value of 4.88 eV when measured with ultraviolet photoelectron spectroscopy (UPS) and 5.46 eV when measured with a Kelvin probe.