Sulfur electron configuration, X-ray photoelectron spectra, and other elemental information – part of the XPS Reference Table of Elements.

2007年5月1日 · The results of systematic XPS measurements of Group IA (H, Li, Na, K, Rb and Cs) sulfates together with NaHSO 4, KHSO 4 and (NH 4) 2 SO 4 are presented. The experiments on the alkali metal salts were preformed on ground powders at both liquid nitrogen and room temperatures; concentrated sulfuric acid was measured as a fast-frozen liquid drop.

X-ray photoelectron spectroscopy (XPS or ESCA) curve fitting procedures, reference materials and useful notes are listed here to provide a starting point for the consistent interpretation of XPS spectra. These reference pages contain tips and techniques that are designed to help both the novice and advanced XPS user.

硫磺的电子配置，X射线光电子谱和其他元素信息，都是XPS元素参考表的一部分。 了解更多关于硫磺的详细信息，探索赛默飞的科学研究工具。

2022年10月15日 · The TiO 2 /SO 42− coating by means of the PEO technique adding H 2 SO 4 in the solution and varying the power supply is synthesized in this work. Here, the materials are characterized by XRD and XPS, and also DFT simulations are carried out to elucidate the chemical composition and the species present in the S-doped TiO 2 matrices.

The Basic XPS Information Section provides fundamental XPS spectra, BE values, FWHM values, BE tables, overlays of key spectra, histograms and a table of XPS parameters.

2007年5月1日 · Fourier transform infrared spectroscopy (FTIR) and X-ray photoelectron spectroscopy (XPS) analysis indicated that hydroxyl group on the sorbent surface (M–OH) played the most key role in the phosphate adsorption.

Based on such improved XPS analyses, the binding energies (BEs) of S2p signals for sulfur of increasing oxidation state are determined to be 166-167.5 eV for S=O in dimethyl sulfoxide, 168.1 eV for S=O in polysulfone, 168.4 eV for SO in polystyrene sulfonate and 168.8. eV for SO in chondroitin sulfate.

在所有现代表面分析技术中 ,使用最早 、最广泛也是最成功的当推 X 射线光电子能谱 ( X2 ray Photoelect ron Spect roscopy 简称 XPS) [1. 2 ] , 也即化学分析用的电子能谱 ( Elect ron Spec2 t roscopy for Chemical Analysis 简称 ESCA) 。 XPS 与其它表面分析技术相比 ,最显著的特点是 不仅能测定表面的组成元素 ,而且能确定各元素的化学态 。 它能检测除 H、He 以外周期表中 所有的元素 ,且具有很高的灵敏度 。 此外 ,它还有一些别的特殊用途 。 © 1994-2009 China …

We combine X‐ray photoelectron spectroscopy, gas chromatography, and density functional theory to unravel the sudden emergence of propylene oxide after adding sodium perchlorate to the electrolyte...