Feb 28, 2003 · TaON and Ta 3 N 5, Ta 5+-based (oxy)nitrides, were studied as visible light driven photocatalysts. Under visible light irradiation (λ≥420 nm), the (oxy)nitrides oxidize water to O 2 and reduce H + to H 2 in the presence of sacrificial reagents (Ag + and methanol). TaON oxidizes water into O 2 efficiently, with a

Sep 1, 2015 · The X-ray diffraction (XRD) pattern of TaON was refined using the monoclinic structure (β-TaON, space group P2 1 /c (No 14)) taken from ICSD database card 98662. The profile parameters included the scale factor, a sample displacement parameter, and a three-term polynomial for the background.

May 19, 2023 · Herein, we have synthesized semiconductor heterojunction photocatalyst, i.e., TaON/CdS with suitable band positions by a simple precipitation method. Ratio between two semiconductors is optimized to obtain maximum hydrogen evolution. XRD, XPS and TEM analysis demonstrate the formation of heterojunction between these semiconductors.

Oct 28, 2020 · We implemented a combinatorial, material discovery approach that used pulsed laser deposition (PLD) for thin-film growth, X-ray diffraction (XRD) for phase determination, and machine learning for data reduction. A lateral compositional gradient of TaO x N y was grown across the surface of an α-Al 2 O 3 (012) wafer. After annealing, XRD ...

Presented herein is a detailed discussion of the properties of the lattice dynamic and optoelectronic properties of tantalum (V) oxynitride (TaON) and tantalum (V) nitride (Ta3N5), from...

We implemented a combinatorial, material discovery approach that used pulsed laser deposition (PLD) for thin-film growth, X-ray di raction ff (XRD) for phase determination, and machine learning for data reduction. A lateral compositional gradient of TaOxNy was grown across the surface of an -Al2O3 (012) wafer.

Feb 24, 2021 · Figure 2a displays the XRD patterns of TaON, TaON-350, TaON-400, and TaON-450. The XRD pattern of TaON exhibits a monoclinic structure, which is ascribed to the P 2 1 / c space group [ 52 ]. The characteristic diffraction peaks at 2 θ = 29.11°, 32.66°, 35.15°, 35.69° are attributed to the typical XRD pattern of β-TaON (JCPDS 70–1193).

Sep 1, 2020 · The crystallography of the films was studied by X-ray diffraction (XRD) (D/Max200PC Diffractometer with CuKα 1 radiation over a 2θ range from 5° to 80°; the accelerating voltage and applied current were 40 kV and 30 mA, respectively). The film morphology and elemental composition were determined with SEM/EDX (Hitachi SU …

In recent years, tantalum oxynitride (TaON) semiconductor as one of the most efficient photocatalysts has been studied intensively owing to the appropriate potentials for overall solar water...

Recently, TaON has become a promising photoelectrode material in the photocatalytic field owing to its suitable band gap and superior charge carrier transfer ability. In this work, we prepared a...