The results of the study are supported by X-ray diffraction (XRD), Fourier transforms infrared spectroscopy (FTIR) analysis, and differential scanning calorimetry (DSC).

2022年9月1日 · We elucidated that the deformation capability of poly(tetrafluoroethylene) (PTFE) can be evaluated via X-ray diffraction (XRD) measurements. In the forming process of PTFE, deformation capability is a key to obtain superior stuffs.

Typical compression curves of Teflon are shown in figure 1. These measurements were made at the temperatures indicated, but the curves are shown displaced along the vertical or compression axis to reduce overlapping. The numerical compression data …

2010年7月15日 · X-ray diffraction (XRD) enabled the determination of the crystallization system, cell lattice, and index of crystallinity of the material in addition to the presence of...

Mixtures of CaCO3, TiO2 and Fe2O3 were dry-grinded in Teflon or zirconia containers using planetary ball-mills at different rotations (200, 300 and 500 rpm) and for various periods of time.

Abstract—Samples of polytetrafluoroethylene were studied by Xray diffraction. A quantitative Xray powder diffraction analysis of three components of the polymer was performed for the first time. All samples of poly tetrafluoroethylene were found to be threephase and consist of one crystalline and two amorphous phases.

At temperatures below 15° C, X-ray diffraction patterns indicate a three-dimensional orientation [2]. Because the long polymer molecules are not straight over their entire length, the structure of Teflon is never completely crystalline.

2023年1月1日 · The X-ray diffraction (XRD; D8 ADVANCE, Bruker, Germany) patterns of pristine PTFE and PDMS/PTFE hybrid samples were recorded by a diffractometer using a Cu Kα source (λ = 0.15406 nm) at a scanning rate of 5°/min between 5° and 85°.

The deformation mechanism and phase transition behavior of polytetrafluoroethylene (PTFE) under stretching conditions (25, 50, 100 °C) were investigated by using differential scanning calorimetry (DSC), small angle X-ray scattering (SAXS), and X-ray diffraction (XRD).

1998年1月2日 · Thin films of crystalline polytetrafluoroethylene (PTFE) were prepared by pulsed-laser deposition using 248 nm UV-excimer-laser radiation. Pressed powder pellets and bulk PTFE have been employed as target material.