Transmission electron microscopy (TEM) is a high-resolution imaging technique in which a beam of electrons passes through a thin sample to produce an image. The electron beam is impacted by the sample’s thickness/density, composition and, in some cases, crystallinity.

透射电子显微镜（TEM） TEM全称为Transmission Electron Microscopy，即透射电子显微镜。针对所有材料科学应用提供快速、精确和定量表征的TEM透射电子显微镜成像。 联系我们

The Thermo Scientific Metrios AX transmission electron microscope (TEM) is the first TEM dedicated to providing the fast, precise characterization and reference metrology that semiconductor manufacturers need to develop and control their wafer fabrication processes in order to accelerate profitable yield.

Thermo Fisher Scientific introduces the Spectra 200 (S)TEM – the high-throughput, aberration-corrected, scanning transmission electron microscope for all materials science applications. Register below to watch our recorded webinar and learn more about how the Spectra 200 (S)TEM delivers the highest-quality data for all applications.

SNSF has successfully commissioned the new state-of-the-art Thermo Fisher Spectra 300 monochromated, double-corrected scanning transmission electron microscope in June 2023. The main features of the TEM are: Instrument Resolution: Need imaging or training? Request it! Have a question? Ask!

赛默飞世尔科技推出了Thermo Scientific Spectra 300 (S)TEM，这是一种适用于所有材料科学应用的最高分辨率像差校正扫描透射电子显微镜。 所有的Spectra 300 (S)TEM都安装在新平台上，旨在通过被动和（可选配）主动隔振提供前所未有的机械稳定性和最高成像质量。 该系统安装在一个完全重新设计的外壳内，内置屏幕显示，便于装载和取出标本。 这是 电子显微镜 首次可以对无矫正器和单矫正器配置时的不同高度提供完全模块化和可升级性，从而为不同的房间配置提供最大 …

Thermo Scientific Talos F200X STEM 是一款扫描透射电子显微镜，其将出色的高分辨率 STEM 和 TEM 成像与业界领先的能量色散 X 射线光谱 (EDS) 信号检测相结合。采用构合映射的 2D/3D 化学表征由具有独特清洁度的 4 个柱内 SDD Super-X 探头执行。

The Thermo ScientificTM IliadTM Ultra (S)TEM is a fully integrated analytical (scanning) transmission electron microscope featuring the new Iliad EELS Spectrometer and Energy Filter with the dedicated Zebra EELS Detector, the new NanoPulser Electrostatic Beam Blanker, and the highly sensitive Thermo Scientific Ultra-X EDX Detection System.

Themis Z TEM delivers both performance and flexibility in one tool. The probe corrected Themis Z TEM, for example, delivers the highest (60 pm) STEM resolution as well as providing in situ, dynamic and 3D EDS and tomography imaging without the need for non-standard holders or sample types. Higher

The FEI Tecnai G2 F20 X-TWIN Transmission Electron Microscope has a field-emission gun (FEG) for high brightness and coherency, STEM imaging with both EDS and EELS analytical analysis capabilities, and CCD camera for standard TEM imaging. The Tecnai specifications are as follows: Need imaging or training? Request it! Have a question? Ask!