XPS (Thermo Scientific, Sigma Probe) was used to analyze the layered oxides and nanosheets. A monochromatized X-ray source (Al Kα, hν = 1486.6 eV) was used for the XPS measurements. For these measurements, a Pt substrate (in nanosheet/Pt film) was used to determine the Fermi level.

1998年11月1日 · Thin TiO x films deposited on quartz substrates have been studied using XPS and X-ray diffraction (XRD). It is found that different titanium oxide species coexist in the films. The dependencies of these species on the calcination temperature and …

As a type of titanate, the pseudobrookite (MTi2O5/M2TiO5) exhibits a low thermal expansion coefficient and thermal conductivity, as well as excellent dielectric and solar spectrum absorption...

2017年12月31日 · FT-IR spectra show that Ti atoms are bonded to silica by oxygen bridging atoms in Ti-O-Si bonds. The titanium valence states in TiO2-SiO2 mixed oxides were investigated by XPS, and their spectra report the presence of Ti2+ and Ti3+ cations for high silica concentration, suggesting the formation of oxygen vacancies.

For titanium, the XPS spectra of Ti2p (Figure 4, first column) are characterized by double peaks, Ti2p 1/2 from 457.9 eV to 458.5 eV and Ti 2p 3/2 from 463.6 eV to 464.2 eV, which correspond to...

X-ray photoelectron spectroscopy (XPS or ESCA) curve fitting procedures, reference materials and useful notes are listed here to provide a starting point for the consistent interpretation of XPS spectra.

作气压410pa, 衬底与靶距离为中, xps 测试表 明薄膜中钛氧比均为1∶2. 氧分压对薄膜成分 影响不大, 是由于一定能量的钛的化学活性强, 易于氧化的缘故. 不同氧分压下薄膜的xrd 结果如图3 所 示. 当a r∶o 2= 5∶1 时, 只出现金红石相, 当

The XPS analysis confirmed the formation of structural disordering associated with oxygen vacancies. The highest piezoelectric charge coefficient of 193 pC/N was found for BHT-5 (5% Hf).

1998年7月1日 · These spectra compare the Ti 2p core-level XPS line shape for atomically clean, stoichiometric samples of Ti, Ti2O3, and TiO2; the latter two are UHV-cleaved or fractured single crystals. The Ti0 and Ti4+ peaks of Ti metal and TiO2, respectively, exhibit the simple shapes expected for such core levels.

近常压X射线光电子能谱可以实现在更接近于实际操作条件（气固、固液以及电化学反应）的环境中进行固体表面电子结构动态变化的原位XPS分析，对样品表面的化学状态进行实时表征，获得表面化学状态，组分及电子结构等动态变化信息，从而进行物质表面成分及价态的定性及半定量分析。