XPS Spectra Thulium (Tm) Compounds The XPS Spectra section provides raw and processed survey spectra, chemical state spectra, BE values, FWHM values, and overlays of key spectra. Atom% values from surveys are based on sample, as received, and Scofield cross-sections. Atom% values are corrected for IMFP and PE.

A comprehensive study of atomic-layer deposited thulium oxide (Tm2O3) on germanium has been conducted using x-ray photoelectron spectroscopy (XPS), vacuum ultra-violet variable angle spectroscopic ellipsometry, high-resolution transmission electron microscopy (HRTEM), and electron energy-loss spectroscopy.

2012年6月1日 · Band alignments of Tm 2 O 3 /Si gate stacks were studied by X-ray photoelectron spectroscopy (XPS). According to XPS measurements, it can be noted that a valence-band offset of −3.1 ± 0.1 eV and a conduction-band offset of 2.3 ± 0.3 eV for the Tm 2 O 3 /Si heterojunction have been obtained.

conducted using x-ray photoelectron spectroscopy (XPS), vacuum ultra-violet variable angle spec-troscopic ellipsometry, high-resolution transmission electron microscopy (HRTEM), and electron energy-loss spectroscopy. The valence band offset is found to be 3.0560.2eV for Tm 2O 3/p-Ge from the Tm 4d centroid and Ge 3p

Download scientific diagram | Tm 4d XPS spectra for a Tm-doped sample and for commercial TmCl3 and Tm2O3 samples used as references from publication: Surface thulium-doped TiO2 nanoparticles...

The NIST XPS Database gives access to energies of many photoelectron and Auger-electron spectral lines. The database contains over 29,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron lines.

采用光学方法测量的Er2O3,Tm2O3和Yb2O3的带隙分别是 (6.3±0.1), (5.8±0.1)和 (7.1±0.1)eV;而采用X射线光电子能谱法测量的这三种材料的禁带宽度分别为 (6.2±0.2), (6.0±0.2)和 (6.9±0.2)eV。 两种测量结果的对比分析表明:在误差允许的范围内,利用X射线光电子能谱方法测量稀土氧化物的禁带 …

The International XPS Database provides - XPS survey spectra, XPS peak-fitted spectra, XPS valence band spectra, plasmon spectra, and six (6) tables of BEs.

Band alignments of Tm2O3/Si gate stacks were studied by X-ray photoelectron spectroscopy (XPS). According to XPS measurements, it can be noted that a valence-band offset of −3.1 ± 0.1 eV and a conduction-band offset of 2.3 ± 0.3 eV for …

2017年7月1日 · The high resolution XPS spectra of the O 1s, Zn 2p and Tm 4d peaks were obtained for the undoped and Tm 3+ doped ZnO nanostructures before and after sputtering with Ar + ions for 30 s to remove some chemisorbed species on …