仪器名称透射电子显微镜型号FEITecnaiG2F20S-TWIN最高加速电压200kV点分辨率0.24nm线分辨率0.102nmSTEM分辨率0.19nm分析元素范围B-U主要功能TEM、HTEM、HRTEM、EDS、SAED厂家美国FEI公司出厂日期2011年12月1日主要服务单位材料学院、高分子系、光电系、环资学院、化学系、能源系、物理系、生工食品学院、医学院 ...

The FEI Tecnai G2 F20 X-TWIN Transmission Electron Microscope has a field-emission gun (FEG) for high brightness and coherency, STEM imaging with both EDS and EELS analytical analysis capabilities, and CCD camera for standard TEM imaging. The Tecnai specifications are …

This is a single ended accelerator, that can provide ions through beamline 6 (BL6) in the 20 keV – 400 keV, single charge state, and .8, 1.2 and 1.6 MeV (2+, 3+ and 4+ respectively) for multiple ionized states of certain ions. The accelerator can deliver specific ion species, such as Kr, Xe and others as required by the users.

The FEI Tecnai (G2 Spirit TWIN) is a high quality 120 kV multipurpose TEM, providing high resolution and good contrast. The high-resolution TWIN lens allows for imaging at both moderate and high magnification up to 0.36 nm point-to-point resolution & 0.2 nm lattice resolution.

This transmission electron microscope is typically operated at 120 kV (can easily be aligned at 60, 80, and 100kV if needed) and can image samples at both room and cryo temperatures. The electron source is provided by a Lanthanum hexaboride (LaB6) crystal or a Tungsten (W) filament (currently a LaB6 is mounted).

The Tecnai G2 20 S-TWIN TEM is designed to offer an imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries.

Description: Suitable for high-end TEM / STEM work on a very wide range of materials science problems ranging from nano-materials, metal alloys, polymers to ceramics and minerals.The Super Twin pole-piece offers high resolution imaging in both TEM (2.4 Å) and STEM (~2 Å) modes whilst remaining easy to use and stable in operation.The Bruker X ...

Description: The FEI Tecnai G 2 T20 is MCEM’s main training transmission electron microscope (TEM) used for conventional imaging (CTEM), diffraction and microanalysis (EDS) work on a very wide range of materials science problems ranging from nano-materials, metal alloys, polymers to ceramics and minerals.

主要有三大功能：微观观察、STEM、三维重构。 适用于细胞、细胞器和软物质的二维和三维成像；双轴电子断层扫描三维重构的整体解决方案；在20~120kV之间实现高衬度和高分辨率。

Tecnai G具有无与伦比的任务导向型用户界面,是最先进的 kV 透射电子显微镜 (S/TEM)。 其在 Windows®XP 操作系统下运行,可在个人环境中提供卓越性能, 并具有通用性、 高生产效率和易用性等特点。