
Synthesis and optical properties of light-emitting V2N MXene …
2023年4月1日 · The structure and morphology of the as-prepared V 2 N MXene were characterized using XRD and SEM, as shown in Fig. 3 (a) and (b), respectively. The diffraction …
New Method for the Synthesis of 2D Vanadium Nitride (MXene) …
2020年7月13日 · XRD analysis was carried out to examine the crystal structure of V 2 AlN and V 2 NT x MXene using a Bruker D8 ADVANCE X-ray Diffractometer with Cu Kα radiation. The …
mp-33090: V2N (trigonal, P-31m, 162) - Materials Project
Browse many computed properties for this trigonal V2N compound, including formation energy from the elements, energy of decomposition into the set of most stable materials at this …
N-based single and double transition metal V2N/CrVN
2022年10月15日 · The structural analysis of V 2 N through transmission electron microscopy (TEM) and X-ray diffraction (XRD) indicates its trigonal structure. Also the temperature …
XRD pattern of different thicknesses of CrN/Si (100) films.
With increasing nitrogen ratio in the deposition chamber from 10 to 20%, the structure was changed from (hc)V2N to multi phases of V2N and (fcc) VN (formation of different vanadium …
XRD pattern of vanadium nitride film with different N2 flow
Results exhibited that the phase composition of the VN(Vanadium Nitride) films varies as the ratio of nitrogen to argon gradually increased from 1:10 to 10:10 as follows: VN + V → VN + V2N + …
Figure 2. XRD patterns of V 2 AlN, acid-salt treated V 2 AlN, and V …
Figure 2 shows the comparison of XRD obtained for MAX phase V 2 AlN, the V 2 NT x obtained after treating with an acid− salt mixture and V 2 NT x obtained after delamination by treating …
New Method for the Synthesis of 2D Vanadium Nitride (MXene) …
XRD analysis was carried out to examine the crystal structure of V2AlN and V2NTx MXene using a Bruker D8 ADVANCE X-ray Diffractometer with Cu Kα radiation. The morphology of the …
Study on interfacial characteristics of constituent phases and ...
2022年3月2日 · The microstructure of the vanadium nitride films deposited on the single crystal Si wafer was analyzed by X-ray diffractometer (XRD) with a CuKα source. Hardness and elastic …
N-based single and double transition metal V2N/CrVN
2022年10月15日 · The structural analysis of V 2 N through transmission electron microscopy (TEM) and X-ray diffraction (XRD) indicates its trigonal structure. Also the temperature …
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