VTS 2009 addresses key trends and challenges in the semiconductor design and manufacturing industries through an exciting program that includes Keynote and Plenary Talks, Technical Paper Sessions, Embedded Tutorial, Panels, Hot Topic Sessions, Full-day Tutorials, co-located Workshop, and the Innovative Practices Track.

This paper presents two new conflict-driven techniques for improving transition fault coverage using multiple scan chains. These techniques are based on a novel test application scheme, in order to break the functional dependency of broadside testing.

Santa Cruz, California, USA 03 – 07 May 2009 IEEE Catalog Number: ISBN: CFP09029-PRT 978-1-4244-3769-6 2009 IEEE VLSI Test Symposium (VTS)

2009年4月22日 · VTS 2009 addresses key trends and challenges in the semiconductor design and manufacturing industries through an exciting program that includes Keynote and Plenary Talks, Technical Paper Sessions, Panels, New Topic Sessions, Full-day Tutorials, co-located Workshops, and the Innovative Practices Track.

Conferences > 2009 27th IEEE VLSI Test Symp... The following topics are dealt with: microprocessor test; delay fault testing; signal integrity; BIST; built-in self test; transistor aging; power supply noise; and integrated circuit chip. Need Help?

27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. IEEE Computer Society 2009, ISBN 978-0-7695-3598-2

The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, and verification / validation of microelectronic circuits and systems. The VTS Program Committee invites original, unpublished paper submissions for VTS 2009.

We propose T-Kernel/SS (Secure Storage), a secure file system with access control protection using tamper-resistant chip. The main feature of our system is to protect access control from policy enforcement violation even when the operating system is ...

2008年9月25日 · The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, and verification & validation of microelectronic circuits and systems. Major topics include, but are not limited to:

2024年8月19日 · 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. IEEE Computer Society 2009, ISBN 978-0-7695-3598-2.