2006年10月26日 · The composition and chemical structure of LaNiO 3−x films obtained by a reactive d.c. magnetron sputtering after long time aging in atmosphere were investigated by using high-energy XPS synchrotron radiation at 3000 eV. XPS spectra have revealed a presence of lanthanum and nickel in oxide and hydroxide states.

2020年11月15日 · The structure, composition, and morphology of the Ni 3 C loaded LaNiO 3 NPs are characterized by XRD, XPS, SEM, and HRTEM. The effects of loading different contents of Ni 3 C on the photocatalytic progress are investigated by UV–vis, EIS test, photocurrent test, electrocatalytic hydrogen evolution test, and Tafel analysis.

2019年8月7日 · By combining X-ray photoemission spectroscopy (XPS) and X-ray absorption spectroscopy (XAS) with density functional theory (DFT) calculations, we show that increasing the Sr mole fraction in LSNO system induces an upward shift of the O 2p bands relative to the Fermi level, strengthening Ni 3d–O 2p hybridization, and decreasing ∆, which ...

1989年7月30日 · In this work the surface of LaNi03 and the interactions of CO, CO^ and hydrogen with this perovskite (at different degrees of reduction) were studied using XPS and temperature-programmed desorption (TPD). This information should be of interest in understanding the catalytic behaviour of LaNi03 for CO hydrogenation.

Lanthanide perovskite oxides have attracted much attention as oxygen reduction and evolution catalyst due to their high chemical stability and composition adjustability. Defects strategy has been...

2011年8月3日 · In order to understand the influence of strain and film thickness on the electronic structure of thin films of strongly correlated oxides, we have applied hard x-ray photoemission (HXPS) at 6 keV, soft x-ray photoemission (XPS) at 1.5 keV, and transmission electron microscopy to epitaxial LaNiO 3 films deposited on two substrates: LaAlO 3 ...

2025年1月13日 · Herein, an X-ray photoelectron spectroscopy (XPS) study has been conducted to understand how PtO 2 (g) and RhO 2 (g) react with LaNiO 3 (LNO) thin films grown via atomic layer deposition (ALD) at elevated temperatures (900 °C).

2006年1月1日 · The X-ray photoelectron spectroscopy (XPS) was performed to study surface and volume composition, valence states and the concentration of hydroxyl groups in epitaxial...

X-ray photoelectron spectroscopy (XPS) was used to determine the composition and chemical structure of epitaxial LaNiO3−x films obtained by a reactive dc magnetron sputtering. It was found that, in contrast to the samples synthesized by using solid

Epitaxial thin films of LaNiO 3−x were deposited by using a reactive d.c. magnetron sputtering technique. High-energy X-ray photoelectron spectroscopy was used to analyze the composition and valence states of La and Ni in the films after long time aging in atmosphere.