
XPS is used for investigating the surface chemistry of electrically conducting and non-conducting samples. It provides the following information from the top 10nm of a sample with a spatial resolution between three to a few hundred μm. How does XPS work? A surface is irradiated with X-rays (commonly Al Kα or Mg Kα) in vacuum.
XPS Intensity Calibration
Intensity Calibration for XPS Al Kα and Mg Kα X-ray sources General Information Useful References Contact Information Terms and Conditions
Detection limits in XPS for more than 6000 binary systems using Al …
2014年2月3日 · A simple approach to estimating the detection limits of X-ray photoelectron spectroscopy (XPS) for any element in any elemental matrix is presented, using the intensity of the background at the expected position for the photoelectron peak to be detected.
X-ray Photoelectron Spectroscopy (XPS) is a highly surface sensitive, ultra-high vacuum technique capable of quantitatively measuring the elemental composition and the chemical state of a material’s
Calibrating innovative XPS instruments to boost sales - NPL
X-ray Photoelectron Spectroscopy (XPS) is the most important method used to measure the surface chemistry and structure of materials and coatings in a wide range of industrial sectors. Better understanding of coating chemistry and thickness …
干货分享,非常实用的XPS/AES数据库 - 有机 - 小木虫 - 学术 科研
handbook of monochromatic xps spectra - vol. 1 - the elements and native oxides b. v. crist, xps international, inc., 1999 handbook of monochromatic xps spectra - vol. 2 - commercially pure binary oxides b. v. crist, xps international, inc., 1999 handbook of monochromatic xps spectra - vol. 3 - semiconductors b. v. crist, xps international, inc ...
An analysis of the correlation of theoretical predictions for photoelectron intensities is made with experimental data from an XPS digital database for 46 solid elements measured using a spectrometer with calibrated intensity and energy scales.
For AES and for XPS, many of the calibration issues are similar since they involve the spectrometer rather than the excitation source. Issues concerning the sources are also covered. The major issues for spectrometers are to ensure that …
Practical Guides for X-Ray Photoelectron Spectroscopy (XPS): First ...
This first guide outlines steps appropriate for determining whether XPS is capable of obtaining the desired information, identifies issues relevant to planning, conducting and reporting an XPS measurement, and identifies sources of practical information for conducting XPS measurements.
Average Matrix Relative Sensitivity Factors - NPL - NPLWebsite
2020年2月11日 · We measure the physical and chemical properties of surfaces on materials, ranging from biological samples to electronic components