2004年1月1日 · The crystalline phase and composition of sol-gel-derived lead zirconate titanate (PZT) thin films were successfully analyzed by X-ray photoelectron spectroscopy (XPS). The crystalline phase was determined from deconvolution of Zr3d photoelectron spectra, in which the binding energy reflected the distance from the neighboring ions.

2001年1月1日 · X-ray photoelectron spectroscopy (XPS) was used to detect Ti oxidation states on the surface of the PZT and PLZT bulk ceramics sintered at various temperatures.

2017年3月5日 · The dependence of the chemical states of the constituent elements of a PZT thin film prepared by RF magnetron co-sputtering using ceramic PZT and metallic Pb dual target materials on the Ar+ etching time was studied using XPS. The metallic Pb, lead oxide and Pb in PZT led to the different binding energies of the Pb lines.

1999年3月1日 · We have discussed the growth of epitaxilal YBCO and PZT thin films by the laser ablation technique to make a PZT/YBCO heterostructure. AES and XPS data of these thin films indicates that during the growth of PZT there is Pb deficiency in the thin film that can be compensated by using a target of PZT with 10% excess of PbO.

2004年7月1日 · The dependence of the chemical states of the constituent elements of a PZT thin film prepared by RF magnetron co-sputtering using ceramic PZT and metallic Pb dual target materials on the Ar+...

lead zirconate titanate (PbZrxTi1 xO3, PZT) ceramic − thin film is well known to be one of the potential candi-dates for a cantilever of a scanning probe microscope, an infrared imaging device and a nonvolatile ferro-electric memory. The performance of these devices is closely related to the crystalline phase and the compo-sition of the thin film.

通过 x 射线光电子能谱 (xps) 成功地分析了溶胶-凝胶衍生的锆钛酸铅 (pzt) 薄膜的晶相和组成。 结晶相由 Zr3d 光电子光谱的反卷积确定，其中结合能反映了与相邻离子的距离。

1993年1月1日 · X 射线光电子能谱 (XPS) 用于确定锆钛酸铅 (PZT) 系统中铅 (Pb)、锆 (Zr) 和钛 (Ti) 的相对含量。 标准样品是由金属氧化物混合物通过固态反应制备的具有多种 Zr/Ti 比率的 PZT，XPS 光谱中的分析峰为 Pb4f7/2、Zr3d5/2 和 Ti2p3/2，分别对应于 Pb、Zr 和 Ti .

A low-temperature (≤450 °C) crystallization path for the solution-derived lead zirconium titanate (PZT) thin-film, the first choice for high-density ferroelectric/piezoelectric nanodevices, has...

Download scientific diagram | X-ray photoelectron spectroscopy (XPS) results for PZT layers of variable thicknesses: 5, 20, 50, 150, and 250 nm.: (a) Pb 4 f, (b) Zr 3d, (c) Ti 2p, (d) O 1 s.