XPS 谱图解读. Te3d 有明显的自旋轨道分裂峰（Δ 金属 =10.4eV）。 金属碲的峰形大致对称。 Te3d 和 Cr2p 峰之间直接重叠。 虽然 Te3d/Cr2p 峰干扰严重，但是 Te3d 的自旋轨道分裂峰强度比为 3：2，而 Cr2p 的分裂峰强度比为 2：1。

X-ray photoelectron spectroscopy (XPS or ESCA) curve fitting procedures, reference materials and useful notes are listed here to provide a starting point for the consistent interpretation of XPS spectra. These reference pages contain tips and techniques that are designed to help both the novice and advanced XPS user.

High-resolution XPS spectra of Mg1s, Te3d, and Cd3d for as-deposited (a-c) and heat-treated (d-f) layers grown at 1400 mV with high Mg presence in the bath. In order to develop wide bandgap...

Interpretation of XPS spectra. Te3d region has well-separated spin-orbit components (Δ metal =10.4eV). Peak shape for tellurium metal is approximately symmetric. There is a direct overlap between Te3d and Cr2p peaks. Although Te3d / Cr2p peaks have strong overlap, Te3d spin-orbit components have a 3:2 intensity ratio compared to a 2:1 ratio ...

XPS spectra 1 h and 24 h after etching are shown in Fig. 6a and b, respectively. In both cases, there is a high-intensity peak at 572.2 eV along with a Te peak at 575.6 eV.

In this study, biaxially textured (Bi,Pb)2Sr2Ca2Cu3Ox ( (Bi,Pb)-2223) thin films were fabricated epitaxially on LaAlO3 (LAO) single crystal substrates via chemical solution deposition (CSD) method....

2024年10月1日 · XPS (X-ray photoelectron spectroscopy) was investigated to reveal information about the chemical environment and the creation of NBO (non-bridging oxygen) and BO (bridging oxygen) for the different glass systems. The high-resolution Te3d spectrum confirms the presence of various tellurium-based structural units such as TeO 4, TeO 3, and TeO 3+1.

If trying to differentiate between chromium and tellurium, collect entire Te3d region (550eV–600eV), making sure both Te3d 5/2 and Te3d 3/2 components are acquired. Interpretation of XPS spectra. Te3d region has well-separated spin-orbit components (Δ metal =10.4eV). Peak shape for tellurium metal is approximately symmetric.

1993年10月20日 · X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) was used for the first time to characterize the chemical composition of modified surfaces of Zn x Cd 1−x Te single crystals. These surface treatments were selected for their relevance to device preparation procedures.

High-resolution XPS spectra of the Te 3d region showing the three Te oxidation states observed in this work. We note that cadmium core levels show little dependence on chemical states, in...