Sulfur content is very low and typically requires long acquisition time for good quality S2p spectrum. For spatially uniform samples, minimize X-ray exposure per unit area by acquiring an array of well separated points (linescan or map) with very short acquisition times per point.

The XPS S 2p spectra depicted in Fig. 2A reveal that no S 2p peaks are detected in the CP film, whereas the MSP film exhibits an S 2p spectrum ranging from 166 to 171 eV.

The presence of two sulfur species was detected in X-ray photoelectron spectroscopy (XPS) studies of thiol and disulfide molecules adsorbed onto gold surfaces. These species are assigned to bound thiolate (S 2p3/2 binding energy of 162 eV) and unbound thiol/disulfide (S 2p3/2 binding energy from 163.5 to 164 eV).

XPS 光谱解读. S2p 峰具有紧邻的自旋轨道分裂峰 (Δ=1.16 eV，强度比=0.511) 可以观察到硫单质和硫化合物的自旋轨道分裂。 用户通常观察到分裂谱或由于双峰未分离引起的峰形不对称，具体取决于化学状态和/或仪器分辨率。 如同 S2p，S2s 峰显示大范围的化学位移。

The peaks at 399.2 ± 0.2 eV in N1s are identified as the C--N-C bond from the triazole ring of ATT molecules [49], and the peaks at 162.5 ± 0.3 eV and 167.9 in S2p are defined as the S-C bond ...

Interpretation of XPS spectra S2p peak has closely spaced spin-orbit components (Δ=1.16eV, intensity ratio=0.511). Effect of spin-orbit splitting can be observed for sulfur elements and compounds.

2015年8月28日 · The identification of surface sulfide and polysulfide species based on the curve fitting of S2p photoelectron spectra and, for the first time, of X-ray excited S KLL Auger spectra has been performed. The different sulfur chemical states present on the surface (sulfide S2−, central S and terminal S in polysulfide ch

X-ray photoelectron spectroscopy (XPS or ESCA) curve fitting procedures, reference materials and useful notes are listed here to provide a starting point for the consistent interpretation of XPS spectra. These reference pages contain tips and techniques that are designed to help both the novice and advanced XPS user.

2003年12月10日 · The core level XPS experiments were carried out at MAX II synchrotron source (Lund, Sweden) at beam line I411 equipped with an SX-700 monochromator (Zeiss) and an SES-200 electron analyzer (Scienta) operated at pass energy of 10–20 eV.

In this report, we demonstrate that continuous improvement in XPS instruments and the calibration standards as well as analysis with standard component-fitting procedures can be used to determine the binding energies of compounds containing phosphorus and sulfur of different oxidation states with higher confidence. Based on such improved XPS