XPS characterization and optical properties of Si/SiO2, …
1998年7月18日 · X-ray photoelectron spectroscopic (XPS) analysis of these films revealed that the main low valency Si state was SiO x (0<x <2) for Si/SiO 2, and Si for Si/Al 2 O 3 and …
illustrates the Si 2p and O 1s XPS spectra of -SiO 2 at
High resolution X-ray Photoelectron Spectroscopy (XPS) core-level Si 2p and O 1s spectra of the nonconductors α-SiO2 (quartz) at 120 and 300 K and vitreous SiO2 at 300 K were obtained …
XPS spectra of SiO2: (a) Si 2p and (b) O 1s. - ResearchGate
The XPS spectra revealed two characteristic peaks of the 2p states of silicon (Fig 7.16c) linked with the SiO2 signal, which were in good accord with the literature [322]. XPS report revealed...
(PDF) Silicon (100)/SiO2 by XPS - ResearchGate
2013年12月1日 · We report the XPS characterization of a thermally evaporated iron thin film (6 nm) deposited on an Si/SiO2/Al2O3 substrate using Al Ka x-rays. An XPS survey spectrum, …
Thermally grown SiO2 layers on Si (100) substrate have been subjected to different external voltage bias during XPS analysis to induce changes in the measured binding energy …
XPS Studies of SiO2/Si System under External Bias
2003年3月12日 · Thermally grown SiO 2 layers on Si (100) substrate have been subjected to different external voltage bias during XPS analysis to induce changes in the measured binding …
硅—二氧化硅界面过渡区的XPS研究 - 物理学报
本文报道了用X射线光电子能谱的角度效应研究硅-二氧化硅界面过渡区的结果。 样品为 (111)取向的硅单晶片上低温 (700℃)氧化生成的超薄氧化膜,膜的厚度不大于50?。 氧化膜与单晶衬底 …
Silicon Spectra – SiO2 - The International XPS Database 1
The XPS Spectra section provides raw and processed survey spectra, chemical state spectra, BE values, FWHM values, and overlays of key spectra. Atom% values from surveys are based on …
XPS analysis on SiO2 sol-gel thin films - ScienceDirect
1995年12月29日 · In this work thin films of silicon oxides prepared using the sol-gel and the dip-coating methods have been studied. Films prepared using different percentages of TEOS and …
XPS characterization and optical properties of Si/SiO2, …
1998年7月18日 · X-ray photoelectron spectroscopic (XPS) characterization was performed for the films with different Si contents and different heat-treatment temperatures. Optical properties, …