2022年2月1日 · A fast reduction of U 6+ to U 4+ occurs on semiconductors during XPS measurement. Slower breakage of uranyl occurs on non-semiconductors under X-ray irradiation. XPS measurement could change the elements state even if far from the center of beam.

2018年5月29日 · The U4f XPS observed for UO 2 exhibits narrow and symmetrical pointed peaks (FWHM = 2.09(5) eV), with maxima at 380.2(1) and 390.9(1) eV for the 7/2 and 5/2 components of the spin orbit split...

2023年6月1日 · The current study aims to recognize the valences of uranium in U 3 O 8 by a simple X-ray photoelectron spectroscopy (XPS) investigation. U 3 O 8 mixed with TiO 2 was photocatalytically reduced under UV or X-ray irradiation, and the chemical

2021年11月21日 · XPS is a surface analysis method which uses X-rays to generate photoemission at the surface of materials, which causes the ejection of electrons from either the inner core electron shells or the valence electron shells. The core levels have well-defined binding energies specific to the elemental species being considered [4].

2009年5月1日 · Here, we examine XPS spectra of a series of uranyl minerals of different composition and structure and try to understand what information can be extracted from the resultant spectra. The U 4f peaks are the strongest and most resolved peaks in the XPS spectrum of U (e.g. Teterin et al., 1981).

该研究确定了 XPS 检测过程中 X 射线照射引起的 U 4f 光谱的变化。 对于非半导体上的 U (VI)，由于铀酰分子的断裂，X 射线辐射导致 U 4f 7/2 负移至 ~ 380.8 eV，但未产生 U (IV) 物质。 然而，由于 U (VI) 的光催化还原，U (VI) 负载半导体的辐照迅速引起 U 4f 7/2 的负移 峰值达到 ~ 379.8 eV，这是 U (IV) 的特征。 此外，即使样品远离 X 射线束的中心 (>3971 μm)，也会发生明显的光还原。 基于这些发现，提出了减少由 X 射线照射引起的潜在误差的方法，包括使用最短扫描时 …

2013年12月27日 · The role of modifying the U-O interaction by changing the U-O distance has been investigated and an unexpected correlation between U-O distance and XPS satellite intensity has been discovered. The role of flourite and octahedral crystal structures for U(IV) oxides has been examined and relationships established between XPS features and the ...

A rigorous study is presented of the physical processes related to X-Ray photoelectron spectroscopy, XPS, in the 4f level of U oxides, which, as well as being of physical interest in themselves, are representative of XPS in heavy metal oxides.

1996年1月15日 · The U 4f x-ray photoemission spectroscopy spectra have been measured on UB 12, UC, UGe 2, and U 3 Ge 4. The measured spectra are decomposed into the main lines and the satellites by nonlinear least-squares fitting to the theoretical …

u 4f线通常用于通过x射线光电子能谱（xps）确定铀的氧化态。 相反，很少记录到铀的浅核心水平的XPS。 尽管如此，理论表明，U 5d（和5p）多重结构对氧化态非常敏感。