Characterization of (Al)GaAs/AlAs distributed Bragg mirrors …
2008年8月15日 · Optical reflectance (R) and high-resolution X-ray diffraction (HR XRD) have been used for characterization and verification of the distributed Bragg reflectors (DBR) grown …
High-Quality Crystal Growth and Characteristics of AlGaN-Based …
2016年7月6日 · The TEM and XRD results show that a state-of-the-art DBR structure with atomic-level-flatness interfaces was achieved. The DBR exhibits a peak reflectivity of 86% at the …
Effect of distributed Bragg reflectors on photoluminescence …
2022年6月29日 · Atomic force microscopy and X-ray diffraction (XRD) were used to investigate the influence of ozone treatment on the structure of the substrates. The hybrid …
Vertically Conductive Single-Crystal SiC-Based Bragg Reflector …
2015年11月25日 · We propose and demonstrate for the first time the use of the SiC-on-Si technology to fabricate a vertically conductive single-crystal distributed Bragg reflector (DBR) …
Deep ultraviolet distributed Bragg reflectors based on graded ...
2015年6月4日 · Distributed Bragg reflectors (DBRs) with peak reflectivity at approximately 280 nm, based on compositionally graded Al x Ga 1−x N alloys, were grown on 6H-SiC substrates …
Studies on the Material and Photoluminescence Characteristics of …
2022年11月7日 · Al0.9Ga0.1As/GaAs distributed Bragg reflector (DBR) structure with different doping type and doping concentrations was grown by metal organic chemical vapor deposition …
Crack-free AlGaN/GaN distributed Bragg reflectors synthesized by ...
2014年11月1日 · Crack-free AlGaN/GaN distributed Bragg reflectors (DBRs) for the near-UV region were grown on 6H-SiC substrates by metal–organic chemical vapor deposition …
Structural characterization of porous GaN distributed Bragg …
2019年12月4日 · Here, we show that high-resolution x-ray diffraction (XRD) offers an alternative, nondestructive method for characterizing porous nitride structures. XRD scans of porous GaN …
用于紫外探测器DBR结构的高质量AlGaN材料MOCVD生长及其特 …
利用MOCVD方法在(0001)取向的蓝宝石衬底上实现了不同工艺条件下的高质量AlGaN材料的制备.得到了无裂纹的全组分AlxGa1-xN(0x1)薄膜.通过XRD，SEM，AFM等测量分析方法系统研究 …
2021年12月4日 · The surface and cross section of the DBR samples were observed by scanning electron microscopy (SEM). The surface roughness and morphology of the DBR samples were …