一文读懂|如何利用XRD进行织构分析？-微信文章-仪器谱
2020年9月8日 · 织构研究主要有以下几种方法： 现 在的织构分析方法，以xrd和ebsd为主，两者各有优劣，很多时候两者往往结合使用： xrd法制样简单、测量结果较为宏观； ebsd法制样复杂 …
X射线衍射测定残余应力之侧倾法与摆动法 - 知乎
2024年12月18日 · 侧倾法 (χ法）是应力方向平面 ( \psi 平面）与扫描平面（2 θ 平面）相互垂直的应力测定方法。 在测定过程中，2 θ 平面绕χ轴相对转动（如图1和图2所示），它与试样表面 …
X-Ray Diffraction in Porous Silicon - SpringerLink
2014年1月1日 · X-ray diffraction (XRD) is a useful, complementary tool in the structural characterization of porous silicon (pSi), providing information not readily available from direct …
Determination of Residual Stresses by X-ray Diffraction
2002年1月1日 · There is currently no published standard for the measurement of residual stress by XRD. This guide has been developed therefore as a source of information and advice on …
ray diffraction (XRD), or ultrasonics, have been developed during the last century to measure them. X-ray diffraction technique has been widely used in industries and laboratories for …
A modified X-ray diffraction method to measure residual normal …
2022年1月7日 · X-ray diffraction (XRD) is a powerful analytical tool in characterising polycrystalline materials owing to its accurate measurement of lattice d-spacings. An important …
PANalytical Stress is dedicated to the analysis of XRD residual stress measurements according to the classical single-{hkl} sin2Ψ method. Both measurement types, known as the chi-stress …
To measure residual stress as a function of depth using X-rays, you may need to carefully remove some of the surface. The stress relief that occurs will have to be accounted for. However, if …
When applying the Sin²ψ technique to x-ray diffraction (XRD) based residual stress measurements, both the normal and shear stress components can be easily and accurately …
X射线衍射方法测量残余应力原理与方法（黄继武老师亲授）_x射 …
2023年5月4日 · X射线衍射测量残余内应力的基本原理是以测量衍射线位移作为原始数据，所测得的结果实际上是残余应变，而残余应力是通过胡克定律由残余应变计算得到的。 其基本原理 …