2018年8月27日 · XRD patterns of the synthesized PtSe 2 film, absorption spectrum of CdTe, electrical contacts and photoresponse of CdTe and PtSe 2, response speed of PtSe 2 /CdTe heterojunction PD at 1 kHz, and stability of PtSe 2 /CdTe heterojunction PD .

Raman spectra measurements were carried out on a HORIBA Raman spectrometer with a 488 nm argon ion laser. The X-ray diffraction (XRD) pattern was recorded using a RigakuSmartLab X-ray...

2024年10月21日 · In summary, detailed Raman analysis and XRD measurements confirm the high-quality growth of PtSe 2 by our newly developed MOCVD approach. In addition, XPS measurements support the conclusions drawn from Raman and XRD analysis.

2019年5月29日 · Here we developed a two-step chemical vapor deposition (CVD) method to synthesize large-area PtSe 2 films with high crystallinity on diverse substrates, such as silicon, quartz, and sapphire.

2020年6月1日 · Particularly for PtS 2, the deviation can be explained by XRD measurements as 2–4% of PtS is detected (Fig. 3), resulting in a lower chalcogen-metal ratio. At the same time, XRD disclose high preferential orientation and purity for both PtSe 2 and PtTe 2. They exist as few layers in a well-ordered stacking structure based on their conspicuous ...

Scanning transmission electron microscopy (STEM) images (measured by Thermo Scientific Spectra 300) and X-ray diffraction (XRD) patterns (obtained by Smartlab9KW) are employed to elucidate atomic structure and crystal quality of the prepared layered PtSe 2.

2023年11月21日 · Large-area 2D PtSe 2 layers enable the in situ fabrication of highly integrated device arrays based on PtSe 2 /AlO x /Ge Schottky junctions, demonstrating an admirable MIR imaging capability at room temperature. Our study presents a novel approach for the fabrication of novel uncooled broadband IR photodetectors.

2021年2月1日 · The structure and chemical composition of PtSe 2 samples were investigated by several methods – Raman spectroscopy, synchrotron-radiation high-resolution XPS, RBS. The results obtained from XRD and XRR measurements confirm the high quality of the films. PtSe 2 layers are aligned horizontally with the c-axis perpendicular to the substrate. The ...

Scanning transmission electron microscopy (STEM) images (measured by Thermo Scientific Spectra 300) and X-ray diffraction (XRD) patterns (obtained by Smartlab9KW) are employed to elucidate atomic structure and crystal quality of the prepared layered PtSe 2.

2018年4月18日 · In this paper, we report a custom-designed CVT setup to synthesize PtSe 2 single crystal, followed by a mechanical exfoliation method to fabricate the atomic layers, as shown in Fig. 1c. The...