2013年10月1日 · In the following we report a scanning electron microscopy (SEM) and atomic force microscopy (AFM) morphological characterization of ZnO surfaces subjected to FIB milling, both sputtering-deposited thin-films and commercial single crystal substrates.

2024年3月30日 · AFM images characterize the ZnO film which deposited at 500 W at 3 × 3 μm area (1-c) for 2D and (1-d) for 3D. AFM images show small grains and highly textured structure (spherical form) with diameter varied between 50 nm and 75 nm.

2021年2月28日 · In this paper, ZnO nanomaterials, including nanorod and nanowire are characterized by atomic force microscope (AFM) and nanomanipulator embedded in scanning electron microscope (SEM) respectively, which can manipulate and observe simultaneously, and is efficient and cost effective.

... force microscopy (AFM) analysis is a commonly used technique for the determination of the size of NPs. AFM gives us insight about the roughness of ZnO NPs (Femi et al., 2011)....

2023年1月1日 · The advanced fractal features, crystalline structure and optical properties of sputtered samples were investigated by atomic force microscopy (AFM), X‐ray diffraction (XRD) and UV–vis spectroscopy. Microstructural studies revealed homogeneously granular structure of ZnO layer and axially oriented granular structure of AZO thin film.

基材上生长ZnO 薄膜,使非织造布除了具有一般纺 织材料的特征之外,还具有更为独特的网络结构、丰 富的表面积和均匀的孔隙等优异性能;运用磁控溅 射在其表面沉积ZnO 纳米结构薄膜,赋予非织造布 材料特殊的紫外光吸收功能,且还具有柔软性、耐弯

2009年12月29日 · Zinc oxide (ZnO) thin film transistors were fabricated by local anodic oxidation (LAO) of polycrystalline zinc film using an atomic force microscope (AFM). Nanometer-thin zinc film can be locally transformed into $p$-type zinc oxide by an anodic oxidation technique using an AFM at room temperature.

2016年4月29日 · In this study, surface structures of two zinc oxide (ZnO) thin films, prepared by sol–gel spin and dip-coating methods, were investigated. Ex situ Atomic Force Microscopy (AFM), X-ray diffraction (XRD), and X-ray reflectivity measurements were carried out in order to study the surface structure.

2025年3月13日 · This study investigates the growth of nitrogen-doped zinc oxide (N: ZnO) thin films on silicon (Si) substrates using RF magnetron sputtering. X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), were used to analyze the films. Atomic force microscopy (AFM) was employed to examine the grain size, distribution, and surface morphology. Results indicated that the annealing ...

zno多层膜,用afm 观察薄膜表面形貌的变化,用 电阻仪测试其导电性能,以探寻一种高透明低电阻、 可调控的光电功能薄膜,并且具有柔软 、耐弯曲、可