In this study, a ZrO2-based dielectric film and its interface (with an ultrathin TiO2/Al2O3 buffer layer) are analyzed using angle-resolved X-ray photoelectron spectroscopy (ARXPS), spectroscopic...

Handbooks of Monochromatic XPS Spectra Volume Two - Commercially Pure Binary Oxides 828 Sample Description: ZrO2 (99.9%) from Aldrich Lot# 02310BV (<100 ppm HfO2), pressed into 3 mm pellet, analyzed at 35deg TOA, mesh-screen at 1 mm height

The XPS Spectra section provides raw and processed survey spectra, chemical state spectra, BE values, FWHM values, and overlays of key spectra. Atom% values from surveys are based on sample, as received, and Scofield cross-sections. Atom% values are corrected for IMFP and PE. Peak-fits are guides for practical, real-world applications.

2018年3月1日 · By using UV-vis spectra and X-ray photoelectron spectroscopy analysis method, studies the photosensitive ZrO 2 gel film of photochemical reaction process and the photosensitive mechanism, to determine the zirconium atom centered chelate structure, reaction formed by metal chelate Zr atom for the center, and to establish the molecular model of th...

借助nap-xps，xps可以探测出明显脱气的颗粒，中等挥发性的液体，生物样品，多孔材料和/或聚合物材料。 在此提交中，我们显示了对ZrO2颗粒的窄幅（Zr 3p，Zr 3d和O 1s）和俄歇（O KLL）NAP-XPS扫描的结果。

The high-resolution XPS spectrum of W4f was deconvoluted into two peaks at 36.1 eV and 38.19 eV, which represent W4f 5/2 and W4f 7/2 and indicate that tungsten is strongly bound with oxygen in +...

2018年4月15日 · Tetragonal zirconia (t-ZrO2) nanoparticles were successfully prepared by a hydrothermal method and characterized by various measurement techniques. The tetragonal crystalline structure of ZrO2 nanoparticles were confirmed by X-ray diffraction analysis. The binding energies of Zr and O were confirmed from the XPS spectrum.

We report the hydrogen barrier performance of sputtered La2O3 thin films for the device stability of amorphous indium–gallium–zinc–oxide (a-IGZO) thin-film transistors (TFTs). Hydrogen acts as a...

【摘 要】用射频溅射制备了氧化锆薄膜，用X光电子能谱技术分析了YSZ膜的结构，发现低能轰击会引起膜中钇的反优再溅射，造成钇的分布不均匀导致单斜相的出现。

With NAP-XPS, XPS can probe particles, moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. In this submission, we show survey, narrow (Zr 3p, Zr 3d, and O 1s), and Auger (O KLL) NAP-XPS scans of ZrO2 particles.