Aluminium electron configuration, X-ray photoelectron spectra, and other elemental information – part of the XPS Reference Table of Elements

Aluminum oxide is an insulating material and the oxide peak position may vary with the thickness of the film. The relative intensities of the oxide and metallic peaks will also change with oxide thickness. This effect allows XPS to measure the thickness of Al oxide films. Al2p peak has closely-spaced spin-orbit components (Δ metal =0.44eV).

这些特征峰能覆盖/遮盖结合能较高的 XPS 峰，如 Si2p 和 Si2s 峰。 铝是一种反应活性较高的金属，因此铝金属的 样品原样 的表面始终存在氧化物。 氧化膜的厚度可能不同，具体取决于做过的清洁处理。 氧化铝可能与存在的氢氧化物发生水合反应。 这些化合物可能与大气中的 CO 2 发生反应，在表面形成碳酸盐。 在 Ar+ 溅射后，活性表面可能会吸收氧，重新形成氧化物。 古人使用铝盐来做媒染剂和收敛剂，但是直到1825年 H.Ørsted 才分离出铝。 1886年取得了最重大的突 …

Wide-energy XPS spectrum for the sample is shown in Figure 4 (b) exhibiting peaks corresponding to Al 2p, Al 2s, C 1s and O 1s at binding energy of 75 eV, 120 eV, 287 eV and 533 eV,...

© 1999 XPS International, Inc. xxx XPS Handbook of The Elements and Native Oxides ALUMINIUM - Naturally Formed Native Oxide native AlO x E l e c t r o n C

The presence of Al2O3/SnO2 and Sn/Al codoping in the 2%Al/6%Sn/Fe2O3 nanostructured photocatalyst is confirmed by the XPS analysis.

2001年5月25日 · XPS, AES and EELS spectroscopies are used to study the surface and near-surface composition of ambient-exposed Al metal. Large-area averaged XPS analysis shows that after prolonged etching the sample consists of Al metal …

As seen on the Al2s spectrum plotted in Fig. 5b, the Al-O peak observed at 120.2 eV of un-etched sample reveals residual Al 2 O 3 compounds. This peak could be correlated with the high Al...

如题在对铝合金表面做XPS分析时，全谱里出现了Al2p和Al2s峰，但是分析时候为什么只分析Al2p峰

Al 2p核心XPS光谱显示金属峰和化合物峰之间有相当大的偏移（约2 eV），金属峰的宽度远小于化合物峰的宽度。 这一事实已用于众多研究中，其中Al 2p光谱可以很容易地曲线拟合以识别出由于金属和由于铝化合物引起的百分比面积。