1994年6月1日 · Surface stoichiometry was tested by XPS-microscopy. The spatially resolved observation of line intensities as well as line shifts revealed an effective metallization and oxidation of the surface. Using atomic force microscopy we found evidence for a 3-dimensional island-like formation of Ca aggregates with a size up to 12 μm diameter.

XPS Spectra Calcium (Ca) Compounds The XPS Spectra section provides raw and processed survey spectra, chemical state spectra, BE values, FWHM values, and overlays of key spectra.

2016年11月15日 · The chemical composition of the surface of the particles was investigated by X-ray Photoelectron Spectroscopy (XPS) and the results indicated the presence of reasonable amounts of hydroxyl groups and oxygen ions in the samples produced with EDA.

Download scientific diagram | XPS high resolution spectra of (a) Ca 2p and (b) F 1s of the CaF2 doped with different Tb concentrations from publication: Luminescence and stability of Tb doped...

The Basic XPS Information Section provides fundamental XPS spectra, BE values, FWHM values, BE tables, overlays of key spectra, histograms and a table of XPS parameters. The Advanced XPS Information Section is a collection of additional spectra, overlays of spectra, peak-fit advice, data collection guidance, material info,

1994年6月1日 · Surface stoichiometry was tested by XPS-microscopy. The spatially resolved observation of line intensities as well as line shifts revealed an effective metallization and oxidation of the surface. Using atomic force microscopy we found evidence for a 3-dimensional island-like formation of Ca aggregates with a size up to 12 μm diameter.

XPS 光谱解读. 当样品中含有镁时，检查 Ca2s 谱峰，避免将 Mg KLL 谱峰误判为 Ca2p 谱峰。 Ca 的几种典型化合物之间的化学位移较小（<1eV）。 在化学测定方面的用途有限。 Ca2p 峰具有明显的自旋轨道分裂峰 (Δ 碳酸盐 =3.5 eV)。 在 Ca2p 区域有时可见卫星能量损失特征峰。

1993年7月1日 · The interfacial properties of CaF 2 on Si(111) under two different deposition conditions are studied using x‐ray photoelectron spectroscopy (XPS). The CaF 2 /Si sample grown at a fixed temperature of 600 °C exhibits B‐type epitaxy. For the second sample, the Si substrate was ramped from 100 to 600 °C in 5 min and then held at 600 °C ...

2024年12月15日 · （1）XPS, 全称为X-ray Photoelectron Spectroscopy（X射线光电子能谱）,是一种收集和利用 X-射线光子辐照样品表面时所激发出的光电子和俄歇电子能量分布 的方法。 XPS可用于定性分析以及半定量分析, 一般从XPS图谱的 峰位和峰形获得样品表面元素成分、化学态和分子结构 等信息，从 峰强可获得样品表面元素含量或浓度（不常用）。 （2）XPS是一种典型的 表面分析手段。其根本原因在于：尽管X射线可穿透样品很深, 但 只有样品近表面一薄层发 …

X-ray photoelectron spectroscopy (XPS or ESCA) curve fitting procedures, reference materials and useful notes are listed here to provide a starting point for the consistent interpretation of XPS spectra. These reference pages contain tips and techniques that are designed to help both the novice and advanced XPS user.