对晶体结构及暴露晶面的分析可分为通过HRTEM（比例尺≤5nm）进行晶格间距的分析和通过SAED对晶体结构和晶相的判断，具体步骤如下： 1、对HRTEM分析. 1.标卡的标定. 打 …

2020年4月22日 · Advanced synchrotron X-ray powder diffraction measurements and TEM analyses on the recovered sample demonstrate that the newly recovered Sn 3 N 4 crystallizes …

利用TEM,STM和PDS显微光度计研究了ECR-PECVD技术制备的Si3N4薄膜的微结构.结果表明：在较低沉积温度下，ECR-PECVD制备的Si3N4薄膜是一种纳米α-Si3N4薄膜，其晶粒粒度 …

2017年8月30日 · The exfoliated FL-GNPs have been investigated by a Philips CM-20 Transmission electron microscope (TEM) at 200 keV and Raman spectroscopy (Witec Alpha …

In this work, the effect of compressive surface stress on thin film membrane fracture was studied by bulge test. In order to create membranes with compressive residual stress at the surface,...

2023年2月22日 · In this Review, time-resolved in situ TEM techniques and their applications for probing chemical and physical processes are discussed, along with emerging directions in the …

2021年4月5日 · We trace morphological and structural changes in Sn/Ge nanofilms in situ via plan-view and cross-sectional TEM up to 250 °C. Metal-induced crystallization of amorphous …

Silicon nitride is a chemical compound of the elements silicon and nitrogen. 4 (Trisilicon tetranitride) is the most thermodynamically stable and commercially important of the silicon …

2023年8月15日 · TEM images of Si 3 N 4 @SiO 2 core–shell composites with different SiO 2 shell thicknesses are shown in Fig. 2 (a)-2 (f). The uniform, dense, and smooth SiO 2 shells have …

In addition to polygonal grains, a SEM picture of S3N4 has some additional columnar grains, which indicate the presence of additional phase (Fig. 3a). This is further confirmed with BSE …