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The Thermo Scientific Talos F200i (S)TEM is a 20-200 kV field emission (scanning) transmission electron microscope uniquely designed for performance and productivity across a wide range of Materials Science samples and applications.

The Thermo Scientific™ Talos F200i (S)TEM is a 20-200 kV field emission (scanning) transmission electron microscope uniquely designed for performance and productivity across a wide range of Materials Science samples and applications.

The FEI Talos F200i S/TEM is a state-of-the-art field emission gun scanning/transmission electron microscope capable of providing micro- to sub nm-scale structural, morphological, and chemical information.

In this work, a new method for preparation of high-quality, site-specific, plan-view TEM samples from thin-films grown on substrates, is presented and discussed. It is based on using a dual-beam focused ion beam scanning electron microscope (FIB-SEM) system.

Discover the potential of the Thermo Scientific Iliad Scanning Transmission Electron Microscope (STEM). Delivering unparalleled insights into complex material systems with integrated features and real-time data processing capabilities. Explore the cutting-edge features of the Iliad with Jo Verbeeck from the University of Antwerp.

The Talos Transmission Electron Microscope offers exceptional high-resolution S/TEM and TEM imaging, along with industry-leading energy dispersive X-ray spectroscopy for signal detection, chemical characterization, and composition mapping.

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The Metrios 6 (S)TEM is a 60–200 kV instrument, designed to deliver high-quality and consistent TEM- and STEM-based imaging, analytics, and gauge-capable metrology results with 20% average productivity improvements. Fast sample throughput is delivered by the Smart Stage, the Ultra-X EDS detector, the new objective lens, the high-brightness X-CFEG