Lamp Test (LT), Blanking (BL), and Latch Enable or Strobe inputs are provided to test the display, shut off or intensity-modulate it, and store or strobe a BCD code, respectively. Several different signals may be multiplexed and displayed when external multiplexing circuitry is used.
The CD54HC4511, CD74HC4511, and CD74HCT4511 are BCD-to-7 segment latch/decoder/drivers with four address inputs (D0−D3), an active-low blanking (BL) input, lamp-test (LT) input, and a latch-enable (LE) input that, when …
The CD4511BC BCD-to-seven segment latch/decoder/ Low logic circuit power dissipation driver is constructed with complementary MOS (CMOS) High current sourcing outputs (up to 25 mA) enhancement mode devices and NPN bipolar output driv- Latch storage of code ers in a single monolithic structure.
Lamp Test (LT), Blanking (BL), and Latch Enable or Strobe inputs are provided to test the display, shut off or intensity-modulate it, and store or strobe a BCD code, respectively. Several …
Lamp Test (LT), Blanking (BL), and Latch Enable or Strobe inputs are provided to test the display, shut off or intensity-modulate it, and store or strobe a BCD code, respectively. Several different signals may be multiplexed and displayed when external multiplexing circuitry is used.