2012年3月1日 · Recently, we reported a STEM annular bright field (ABF) imaging method, which enabled simultaneous visualization of light and heavy elements in iron oxide, silicon nitride and strontium titanate (Okunishi et al., 2009).

2020年12月1日 · 在电子显微镜中，引入了最大后验 (MAP) 概率规则作为从高分辨率环形暗场 (ADF) 扫描透射电子显微镜 (STEM) 图像中确定最可能的原子结构的工具- 噪声比（CNR）。 除了 ADF 成像，STEM 还可以应用于环形明场 (ABF) 区域。 ABF STEM 模式允许在存在重柱的情况下直接可视化轻元素原子柱。 通常，轻元素纳米材料对电子束很敏感，限制了进入的电子剂量以避免电子束损坏并导致图像表现出低 CNR。 因此，不仅将 MAP 概率规则应用于 ADF STEM 图 …

2023年8月2日 · We have theoretically developed an optimum bright-field (OBF) STEM technique for low-dose imaging that enables the observation of atomic structures at the highest signal-to-noise ratio (SNR) using segmented/pixelated detectors (13). Figure 1A shows the schematic of the OBF STEM technique, which uses a segmented detector.

2011年2月13日 · In the present work, using ABF–STEM we demonstrate the first direct imaging of the lightest hydrogen atoms in a crystalline solid. The optimum conditions of ABF–STEM imaging can be derived on...

2020年12月1日 · In the present paper, alternative parametric models for quantifying simultaneously acquired ABF and ADF STEM images are proposed by extending the commonly used parametric models in STEM. This results in alternative analytical expressions for the recently proposed MAP probability rule.

2012年3月1日 · In the present paper, we first describe the ABF technique and its experimental parameters. Then, using experimental data, we explain why ABF imaging is insensitive to sample thickness and defocus, which greatly affects the image contrast in …

2023年11月13日 · STEM成像包含明场像(Annular bright field, ABF), 暗场像(Annular dark field, ADF)和 高角环形暗场像 (High angle annular dark field, HAADF)。由于各种成像模式收集的散射信号接收角度不同，因此在实验过程中可一次获取同一位置的不同图像，反应材料的不同信息。

Annular bright field (ABF) imaging, whereby an annular detector is positioned within the bright field region in an atomic resolution scanning transmission electron microscope, has recently been shown to produce images showing both light and heavy element columns simultaneously [1,2].

ABF-Stem（自适应基于特征的扫描转移电镜成像）是一种用于材料科学和纳米科学领域的高分辨率成像技术。 它结合了传统的扫描透射电镜（STEM）和自适应成像技术，旨在提高对材料结构和化学成分的表征能力。

Annular bright field (ABF) scanning transmission electron microscopy has proven able to directly image lithium columns within crystalline environments, offering much insight into the structure and properties of lithium-ion battery materials.