
Controlled growth of a single carbon nanotube on an AFM …
2021年10月15日 · In this paper, we introduce a simple method to selectively fabricate a single CNT on an AFM tip by controlling the trigger threshold to adjust the amount of growth solution attached to the tip....
In this paper, we introduce a simple method to selectively fabricate a single CNT on an AFM tip by controlling the trigger threshold to adjust the amount of growth solution attached to the tip....
清华大学《AFM》:综述-碳纳米管精密结构控制与组装研究进展
2021年12月30日 · 碳纳米管 (cnt) 具有独特的管状结构,由高度石墨化的原子组成。 由于 sp 2 在显微镜下发现的杂化骨架,其奇特的物理特性和在力学、光学、电学方面的非凡性能受到广泛关注。
Attachment of carbon nanotubes to atomic force microscope probes
2007年10月1日 · One way to improve the tip geometry is to attach carbon nanotubes (CNT) to AFM tips. CNTs are ideal because they have a small diameter (typically between 1 and 20 nm), high aspect ratio, high strength, good conductivity, and almost no wear.
Chemical Force AFM with CNT Tips - IEEE Xplore
2007年11月8日 · In this paper, we focus on preparation of CNT-AFM tips, their chemical modification, and their application. The authors have been trying to use a carbon nanotube (CNT) as an AFM probe tip because of its nanoscale dimension, mechanical and chemical robustness, high aspect ratio, and so on.
New carbon nanotube AFM probe technology - ScienceDirect
2009年10月1日 · Atomic force microscopy (AFM) relies on an ultra sharp tip to interact with and physically measure a sample surface. The technology for the fabrication of AFM probe tips is undergoing rapid evolution with the application of new nanotechnology techniques.
Conductive AFM for CNT characterization - PMC - National …
2013年1月11日 · We report on and emphasize the versatility of conductive atomic force microscopy in characterizing vertically aligned carbon nanotubes (CNTs) aimed to be used in via interconnect technology. The study is conducted on multi-walled CNT arrays vertically grown on a copper-based metal line.
Morphology control and integration of the carbon nanotube tip for AFM
2006年8月1日 · We report the development of atomic force microscope (AFM) tip with a carbon nanotube (CNT). To assemble the CNT on the top of Si tip, we used dielectrophoresis (DEP) which is caused by the difference of the polarizability of a CNT and a medium under a non-uniform electric field.
Conductive AFM for CNT characterization | Discover Nano
2013年1月11日 · We report on and emphasize the versatility of conductive atomic force microscopy in characterizing vertically aligned carbon nanotubes (CNTs) aimed to be used in via interconnect technology. The study is conducted on multi-walled CNT arrays vertically grown on a copper-based metal line.
The Attachment of Carbon Nanotubes to Atomic Force Microscopy …
2020年8月12日 · One method that has been explored since the 1990s is to attach carbon nanotubes (CNT) to AFM tips. CNTs possess a small diameter, high aspect ratio, high strength and demonstrate a high degree of wear resistance. While early indications suggested the widespread use of these types of probes would be routine this has not been the case.
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