Thermo Scientific Scios 2 DualBeam 是一套超高分辨率的分析 聚焦离子束扫描电子显微镜 (FIB-SEM) 系统，可为包括磁性和非导电材料在内的各种样品提供出色的样品制备与 3D 表征性能 。

Thermo Scientific™ Scios™ 2 DualBeam™ 是一种超高分辨率分析 FIB-SEM 系统，可为较广泛的样品（包括磁性和非导电材料）提供出色的样品制备和 3D 表征性能。 通过创新性的功能设计以提高通量、精度以及易用性，Scios 2 DualBeam 是满足科学家和工程师在学术、政府以及工业研究领域高级研究和分析需求的理想解决方案。 使用 Sidewinder HT 离子镜筒快速简便地制备高质量、位点特异性 透射电镜和 原子探针样品。 使用 NICol 电子镜筒的超高分辨率成像，在广泛的样 …

DualBeam 聚焦离子束扫描电子显微镜 (FIB-SEM) 仪器通过将 FIB 的精确样品修饰与 SEM 的高分辨率成像相结合，正好完全这类数据。 赛默飞世尔科技是 FIB-SEM 技术的行业领导者，在 DualBeam 仪器方面拥有超过 25 年的经验。 我们为一系列应用提供了广泛的产品组合和先进的自动化能力，包括透射电镜 (TEM) 样品制备、亚表面和 3D 表征、纳米原型设计和 原位 实验。 TEM sample preparation is considered to be one of the most critical tasks in materials science …

The Thermo Scientific Scios 2 DualBeam is an ultra-high-resolution analytical focused ion beam scanning electron microscopy (FIB-SEM) system that provides outstanding sample preparation and 3D characterization performance for a wide range of samples, including magnetic and non-conductive materials.

2023年11月9日 · 厂家：FEI. 型号：FEI-Scios 2 Hivac. 主要参数： 离子束分辨：小于3nm@30kV，电子束分辨率: 1nm@15kV，样品XY方向移动范围不低于100mm，Z方向不低于50mm，可绕Z轴旋转任意角度倾斜角T范围不小于-4到70度。 用途及功能：

Scios 2 DualBeam is an ultra-high-resolution analytical FIB-SEM system that provides outstanding sample preparation and 3D characterization performance for the widest range of samples, including magnetic and non-conductive materials.

The Thermo ScientifcTM SciosTM 2 DualBeamTM Sy Focused Ion Beam Scanning Electron microscope (FIB-SEM) stem is an ultra-high-resolution analytical system that provides outstanding sample preparation and 3D characterization performance for the widest range of samples, including magnetic and nonconductive materials.

FEI Scios™ 是一款超高分辨率 DualBeam™ 分析系统，能为包括磁性材料在内的众多样本提供出色的二维和三维性能。 FEI Scios 的创新功能可提高通量、精度与易用性，非常适于学院、政府和工业研究环境中的纳米量级研究与分析。

2019年10月31日 · The Thermo Scientific™ Scios™ 2 DualBeam™ is an ultra-high-resolution analytical FIB-SEM system that provides outstanding sample preparation and 3D characterization performance for the widest range of samples, including magnetic and non-conductive materials. With innovative features designed to increase throughput, precision, and ease of ...

FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic materials. A 110 mm stage tilts up to 90˚ and provides a long, eucentric working distance for great flexibility.