2021年2月1日 · Grazing-incidence X-ray diffraction (GI-XRD) is a powerful technique used to evaluate the orientational order of crystalline lattices; however, it provides the...

Figure 4 shows the GIXRD patterns of the Si substrate and the prepared films. By varying the angles of incidence, we found four relatively sharp peaks on the prepared films. ...

Grazing incidence X-ray diffraction (GI-XRD) identified the amorphous structure of the ALD oxide layer. Optical profilometry and spectroscopic ellipsometry (SE) showed stability...

2019年2月1日 · In-situ combined synchrotron XRCT/XRD analyses are performed on a Si-based electrode. Graphene nanoplatelets as conductive additive prevent the electrode macro …

Grazing-incidence X-ray diffraction (GI-fi XRD) is a powerful technique used to evaluate the orientational order of crystalline lattices; however, it provides...

2024年4月15日 · GIXRD allows the crystalline features of surfaces and thin films to be determined. As the angle of incidence varies to larger angles, the depth of penetration of the …

Part of the book series: Springer Series in Surface Sciences ( (SSSUR,volume 51)) The principles of grazing incidence X-ray diffraction (GIXD) are discussed. A sample of a crystalline material …

2016年9月27日 · By applying synchrotron grazing incidence x-ray d -spacing maps, x-ray photoelectron spectroscopy (XPS), and angle-resolved XPS, we have identified a monoclinic …

2001年2月6日 · SiGe is the first heteroepitaxial process to be incorporated in a high-volume Si Fab environment and, as such it introduces new characterization challenges. Heteroepitaxial …

掠入射xrd（gixrd）是专门用来测试薄膜样品的手段。 “掠入射”的含义为X射线的入射角θ很小（<5°），入射的X射线几乎与样品表面平行，当X射线的入射角变小时，其入射深度变浅，有 …