
Adaptive High Voltage Stress Methodology to Enable Automotive …
High Voltage Stress Test (HVST) is critical for screening out latent defects to ensure quality on automotive semiconductor devices. This paper describes a novel
High-voltage stress test paradigms of analog CMOS ICs for gate …
2001年4月29日 · This paper presents the first-ever research on high-voltage stress of analog circuits to enhance their oxide reliability and to reduce the manufacturing cost. The emphasis …
Stress Control Methods on a High Voltage Insulator: A Review☆
2017年3月1日 · This review article provides a comprehensive overview of the many factors that may enhance the level of electric field along the high voltage (HV) insulators, review of existing …
加壓測試(Stress Test)是一種加速篩選具有早期缺陷的元件以維持可靠度的一種技術。 其目的在於迫使具有早期缺陷的元件提早從故障率高的區域進入穩定期。
Reliability modeling is important for determining the working lifetime of HV isolation products that experience continuous HV stress (e.g., 400 to 1500Vpeak) with high frequencies (e.g., 10 kHz …
(PDF) Reducing burn-in time through high-voltage stress test and ...
2006年4月1日 · High-voltage stress testing (HVST) is common in IC manufacturing, but publications comparing it with other test and burn-in methods are scarce. This article shows …
The effectiveness of IDDQ and high voltage stress for burn-in ...
IDDQ testing has been introduced to CMOS production lines for achieving higher quality and reliability. In addition, electrical stress applying method called High Voltage Stress (HVS) …
Electric Stress Control in Cable, Joints & Terminations
The most critical aspect of high voltage cable jointing and termination is control of the dielectric stress originated at the point of screen termination–electric stress control.
The quality of HV isolation is demonstrated by substantial margins using statistical test methods. The reliability of the HV isolation process technology is proven to have high isolation margin by …
Reducing Burn-in Time through High-Voltage Stress Test and …
2006年3月1日 · Editor's note: High-voltage stress testing (HVST) is common in IC manufacturing, but publications comparing it with other test and burn-in methods are scarce. This article …
- 某些结果已被删除