Scanning electron microscopes (SEM) and its abundant attachments for surface observation and analysis are one of the most active instruments at the R&D institutes and quality test sites in the world.

From our most powerful flagship Field Emission SEM with the ultimate resolution, magnification, and analytical flexibility, to our easy-to-use entry level Benchtop SEM, JEOL offers a wide choice of SEMs to suit all applications.

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The new high-sensitivity 4-segmented backscattered electron detector enables 2-pane viewing of a SEM image and a 3D image using Live 3D function. In addition to instantaneous shape determination for samples with complex topographies, depth information can also be acquired.

The Scanning Electron Microscope (SEM) is used for observation of specimen surfaces. When the specimen is irradiated with a fine electron beam (called an electron probe), secondary electrons are emitted from the specimen surface.

The JSM-IT710HR Field Emission SEM is a compact, versatile Schottky Field Emission SEM that delivers the next level of intelligent technology for high spatial resolution imaging and analysis. Our unique in-lens field emission gun and advanced electron optics deliver large probe currents while maintaining a small probe making this microscope ...

Scanning Electron Microscopes (SEM): When resolutions in the nm to sub-nm range are required and the handling of the device thus takes on an important role, JEOL scanning electron microscopes are the first choice.

The Scanning Electron Microscope (hereinafter “SEM”) enables a clear observation of very small surface structures, which is not possible with an optical microscope (hereinafter “OM”).

Increase your scope with the JCM-7000 benchtop SEM. The perfect complement to light microscopy, this compact, tabletop SEM with a magnification range of 10X – 100,000X gives you the power of scanning electron microscopy in a convenient package.

A benchtop SEM with both secondary electron and backscatter electron detectors, plus high and low vacuum modes allow for the study of a wide variety of sample types. Automated montage is built-in for high resolution view over a larger area. Includes montage X-ray map with EDS option.