JEOL continues to be a leading company and supplies the latest TEM to the front line of research activities as a leading company. This page introduces 120kV TEMs suitable for soft materials, 200/300kV TEMs ranging from general-purpose to high-end models, cryo TEMs and semiconductor TEMs, which are becoming more important in recent years, and ...

JEOL is a world leader in the development and manufacture of leading edge, high performance, high stability Transmission Electron Microscopes (TEM). JEOL introduced its first TEM over 70 years ago and has been developing and producing TEMs designed for life sciences and material sciences ever since.

JEOL is the leading global supplier of electron microscopes, ion beam instruments, mass spectrometers and NMR spectrometers. JEOL Imaging and Analysis Solutions and Workflows

Transmission Electron Microscopes (TEM) with 120kV accelerating voltage are widely used in soft material fields such as biology and polymer. We newly developed JEM-120i with the concept of "Compact", "Easy To Use", and "Expandable".

Transmission Electron Microscopes (TEM) of 120kV accelerating voltage are widely used in soft material fields such as biology and polymer. We developed the JEM-120i with the concept of "Compact", "Easy To Use", and "Expandable".

64 bit Windows® compatible control software, TEM Center, is an intuitive user interface designed to maximize ease of operation. Enhanced integration. The TEM Center allows the user to control optional accessories such as high resolution camera and scanning image (BF/DF) observation device through intuitive user-system interaction. Automated ...

TEM用语集是透射电子显微分析方法的基本用语集，由日本东北大学名誉教授、日本电子技术顾问田中通义先生编修，涵盖了透射电子显微分析方法的理论、照射系、透镜系、样品室、检测系、真空系、分光分析、结晶、及图像处理等10个部分的用语解释，约750条。 JEOL News学报是JEOL学术性杂志（年刊），收录各领域使用JEOL设备获得高品质数据的优秀文章。 通过阅读这些文章，读者可以深入了解JEOL最新的技术和其在各个领域所取得的重要应用。 走进日本电 …

The combination of JEOL-patented TEM and EDX systems enables the detection of elements into the nm and sub-nm range. Modern techniques make it possible to achieve an accurate statement about the chemical composition within a very short time. This allows a time-efficient response to problems and questions.

Many users also expect a transmission electron microscope (TEM) to be easy to use for their research and testing purposes. To meet these needs, JEOL has developed the JEM-120i as a next-generation microscope that is easy to use, from operation to maintenance, for both novice and experienced users.

JEM-1400Flash配备了高灵敏度sCMOS相机、超广视野的蒙太奇系统以及光学显微镜图像的联动功能，是一款新型的高通量、高分辨率 的120kV透射电子显微镜。 从生物技术到纳米技术、高分子和高新材料，JEM-1400Flash被广泛应用在多个领域，而且用途越来越广。 其中，以生物领域为首的高分子材料研究、医疗品、病理切片、病毒、由荧光显微镜做过标记的样品等的观察，首先用低倍率确认细胞组织或材料结构、样品位置、观察区域的整体情况，再用高倍率详细观察感兴趣 …