
Defect Inspection - KLA
KLA has a comprehensive portfolio of defect inspection and review systems for advanced chip manufacturing, including additional Surfscan ® unpatterned wafer inspection systems and …
MSIP-REM-1KT-0377281-002 FEC (Front-End-Controller) for …
2014年11月25日 · The FEC (Front-End-Controller) for Phoenix 3/5 Wafer Handler, manufactured by KLA-Tencor Corporation and sold by KLA-Tencor Corporation has an Authorization …
Defect Inspection & Review | Chip Manufacturing - KLA
Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This …
KLA | Leaders in Process Control & Yield Management
2025年3月7日 · KLA is a place for curiosity, intellectual challenges and industry transformation. Job overview: think big, drive progress, enjoy the journey. We develop and manufacture …
[半导体检测-3]:半导体检测领域的领头羊KLA科磊的产品线_kla半 …
2024年9月25日 · 半导体检测领域的领头羊kla科磊(简称kla)的产品线广泛且深入,覆盖了半导体制造和相关电子行业的多个关键环节。 KLA的产品线主要包括用于检验、测量、数据分析的系 …
KLA-Tencor Introduces Comprehensive Wafer Inspection and …
SAN FRANCISCO, July 11, 2016 /PRNewswire/ -- In advance of SEMICON West, KLA-Tencor Corporation (NASDAQ: KLAC) today introduced six advanced wafer defect inspection and …
KLA-Tencor Rolls Out Archer AIM+ - EDN
2005年6月15日 · Metrology giant KLA-Tencor Corp. on Tuesday unveiled its Archer AIM+, an overlay metrology tool that reduces total measurement uncertainty (TMU) by 50 percent …
KLA Corporation - Wikipedia
KLA Corporation is an American company based in Milpitas, California that makes wafer fab equipment. It supplies process control and yield management systems for the semiconductor …
2万字长文:从KLA看量测设备的护城河 - 虎嗅网
2023年5月10日 · 2020年全球半导体量测设备KLA一家独大,市场份额50.8%。 5年来,KLA在全球5大半导体设备企业 (AMAT、LAM、ASML、TEL) 中,表现出了相对更稳定的成长性和 …
Products - KLA
2022年12月6日 · KLA’s comprehensive portfolio of inspection, metrology & data analytic systems helps manufacturers manage yield through the entire IC fabrication process.
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