2022年4月12日 · KLA’s team of engineers developed state-of-the-art technologies that provide the Teron SL670e and Teron SL670e XP systems with the performance required to accurately …

2023年5月10日 · 根据VLSI Research 统计，2020年全球前五大半导体量测公司KLA、应用材料、日立、雷泰光学和创新科技市场份额合计超过82.4%，市场集中度较高， KLA一家独大，全球 …

KLA’s metrology systems address a range of chip and substrate manufacturing applications, including verification of design manufacturability, new process characterization and high …

2022年12月6日 · A stage with industry-leading dynamic range helps to obtain diffraction images at multiple angles to render rich 3D geometrical information. Novel AcuShape® algorithms …

1998-1999年，KLA连续收购了干涉测量(德国Nanopro)、扫描电子显微镜(美国 Amray)、产线图像管理(美国 VARS)和硅片缺陷分析(美国 Uniphase)等技术。 到了新世纪，KLA收购的脚步并没 …

Our metrology solutions provide precise measurement of pattern dimensions, film thicknesses, layer-to-layer alignment, pattern placement, surface topography, wafer geometry and in situ …

KLA Instruments提供光学轮廓仪、探针式轮廓仪、纳米压痕仪、薄膜厚度仪、方块电阻测试仪以及晶圆缺陷检测和量测系统。

DirectIndustry（工业在线展会）为您提供表面缺陷检测系统产品详细信息。规格型号：Teron™ 6xx series，公司品牌：KLA Corporation。直接联系品牌厂商，查询价格和经销网络。寻找更多 …

The eDR7280 is a new generation wafer defect review and classification system from KLA-Tencor that meets high resolution defect review requirements of advanced semiconductor production and

Leveraging KLA-Tencor’s patented AIM™ technology and Archer Analyzer™ software, the Archer 100 enables in-chip metrology and in-field analysis for advance dispositioning and higher …