Using Kelvin probe force microscopy (KPFM) we studied the local charge trapping states at the SiO 2 –oligothiophene interface in a field effect transistor (FET), where SiO 2 is the gate …

钙钛矿太阳能电池测试中经常会用到KPFM，该测试涉及到好几个概念，属于物理学，不懂得小伙伴可能很难理解和区分，以及他们之间的关系如何判断？

Then, we present the pulsed force Kelvin probe force microscopy (PF-KPFM) as an innovative improvement to KPFM, which provides an enhanced spatial resolution of <10 nm under …

SiO2 and Al2O3 surfaces exposed to periodically modulated extreme ultraviolet (EUV) light (lambda = 46.9 nm) have been investigated at the mu m scale by optical microscopy, scanning …

The materials were synthesised as large-area thin-films on SiO2 using direct chalcogenisation of pre-deposited metal films. Alongside XPS, the Raman spectra with several excitation …

2023年3月13日 · KPFM is based on the detection of the electrostatic force component due to a potential difference between the surface and the AFM cantilever's tip, and its subsequent …

2022年9月16日 · A simple implementation of Kelvin probe force microscopy is reported that enables recording topographic images in the absence of any component of the electrostatic …

据报道，开尔文探针力显微镜 (KPFM) 的简单实现可以在没有任何静电力分量（包括静态项）的情况下记录地形图像。 我们的方法基于在数据立方体模式下运行的闭环 z 光谱。

A simple implementation of Kelvin probe force microscopy (KPFM) is reported that enables recording topographic images in the absence of any component of the electrostatic force …

首次在不同湿度条件下使用开尔文探针力显微镜 (KPFM) 对单层和多层二硫化钼 (MoS2) 的表面电势 (SP) 变化进行原位可视化和检测。 N 型掺杂源自 SiO2 衬底，在剥离的 MoS2 中发现，并 …