Low-energy electron diffraction (LEED) is a technique for the determination of the surface structure of single-crystalline materials by bombardment with a collimated beam of low-energy electrons (30–200 eV) [1] and observation of diffracted electrons as spots on a fluorescent screen.

LEED Image Analysis System Model LIM12. Containing low light integration CCD camera, imaging and analysis software, and ambient light cover. Features. Integrated image acquisition and beam energy control on regular and zoomed images; Measurements on live or saved images; Lattice constant calculations; Spot Intensity profile with fine adjustment

2023年4月6日 · 低能电子衍射 （LEED）的原理与 X-射线衍射 相似，不同的是X射线传入固体的深度较深，所得到的结果为体内结构。 LEED是指将能量为10—500eV范围的电子射入晶体，由于晶体中的原子对0—500eV范围内的电子有很大的散射截面，所以背散射电子绝大部分被表面或近表面的原子散射回来，所以LEED是研究表面结构的一个理想手段。 反射式高能电子衍射 （RHEED）用高能电子（10—30KeV）作为探测束。 为测量表面信息，入射电子一般采用掠 …

The LEED 800 delivers exceptionally sharp and bright LEED patterns with high resolution in k-space (typical transfer width of 300 Å at 100 eV). The wide viewing angle (100° at 75 mm sample distance) and minimal shadowing of the screen by the miniature electron gun give a maximum visible LEED pattern.

Full size and high performance characterization tool for surface crystallography of single crystals and “in-situ” epitaxy. The LEED 800 is capable of providing LEED and AES data for a wide range of samples. The larger instrument size allows for higher angular and energy resolution.

The LEED 800 MCP with integral shutter has LEED and AES capabilities using a miniature electron gun, set of concentric grids and a conductive, phosphor coated screen. In addition, this optic model incorporates the high gain of microchannel plates.

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2002年4月19日 · In the paper, a basic approach to the acquisition and processing of diffraction spot intensities of low energy electron diffraction (LEED) images is described. Major attention is paid to the impact of background subtraction methods on structural parameters of solid surfaces.

In this experiment we use low energetic electrons with an energy of 50-500eV to examine surfaces. The depth of penetration of low energetic electrons is limited to a few lattice planes. Therefore, this method is surface sensitive. LEED allows to image a crystal surface by reflection of the electron beam.

2022年8月28日 · Low energy electron diffraction (LEED) is a very powerful technique that allows for the characterization of the surface of materials. Its high surface sensitivity is due to the use of electrons with energies between 20-200 eV, which have wavelengths equal to 2.7 – 0.87 Å (comparable to the atomic spacing).