LaF3 – Lanthanum Fluoride - The International XPS Database 1
The XPS Spectra section provides raw and processed survey spectra, chemical state spectra, BE values, FWHM values, and overlays of key spectra. Atom% values from surveys are based on …
Investigation for oxygen sensor of LaF3 thin film - ScienceDirect
1996年8月1日 · This paper deals with the XPS analysis for a LaF3 thin film oxygen sensor and the improvement in its prop- erties by using CuPc electrode thin-film. it can be calculated from …
Characterization of LaF3 coatings prepared at different temperatures ...
2008年1月15日 · X-ray diffraction (XRD), Lambda 900 spectrophotometer and X-ray photoelectron spectroscopy (XPS) were employed to study crystal structure, transmittance and …
Lanthanum | XPS Periodic Table | Thermo Fisher Scientific - US
Lanthanum X-ray photoelectron spectra, lanthanum electron configuration, and other elemental information. La3d is the primary XPS region, but La4p and La4d regions can help assign the …
Electron beam evaporated LaF3 thin films prepared by different ...
2010年2月1日 · LaF 3 thin films were prepared by electron beam evaporation with different temperatures and deposition rates. Microstructure properties including crystalline structure and …
A study of the LaF3/Si(111) interface using UPS and XPS
1990年6月1日 · The overlayers and the detailed interface reactions were probed with high resolution XPS in our home laboratory, and by soft XPS using the synchrotron source SRS at …
Figure 3. (a) XPS survey spectra of LaF 3 nanoparticles and...
(a) XPS survey spectra of LaF 3 nanoparticles and corresponding deconvoluted XPS spectra of (b) C 1s, (c) La 3d, (d) F 1s, and (e) O 1s. The present work focused on the extreme pressure...
氟离子选择性电极膜 LaF3 的 XPS 研究：离子干扰,Surface and …
xps 已被用于研究发生在氟离子选择性电极膜表面的离子交换过程。 结果表明，离子交换发生的深度远大于最外层固体表面单层的深度。 研究了氢氧根离子干扰对电极响应的影响，并提出了 …
氟离子选择性电极膜 LaF3 的 XPS 研究：表面凝胶层的证 …
xps 已用于检查氟离子选择性电极膜的表面。 已经发现水化学吸附在LaF3晶体的表面上。 在长时间暴露于水中后，在 LaF3 膜上发现了表面降解产物。
Exploring the potential of Tb and Bi-doped LaF3 as a UV absorber ...
2024年12月5日 · X-ray photoelectron spectroscopy (XPS) was performed to determine the elemental presence in the LaF 3:1%Tb,1%Bi nanophosphor. A pellet with a thickness of 1 mm …