
Standards Data - Ug11bm - Argonne National Laboratory
Details of powder diffraction data measured at 11-BM for standard reference materials are listed below and are available in several formats. These are periodically updated. Contact 11-BM staff with questions. Data are typically measured at ~ 30 keV under ambient conditions. Check the file header for full details and scan parameters.
PXRD patterns of the NIST SRM660b LaB6 line-profile standard in …
PXRD patterns of the NIST SRM660b LaB6 line-profile standard in a 0.5 mm capillary collected with the multipurpose diffractometer at a sample-to-detector distance of 50 cm, (a) with the Ge...
XRD patterns of LaB6 particles | Download Scientific Diagram
We explain how doping LaB6 nanoparticles with lanthanide metals (Y, Sm, and Eu) red-shifts the absorbance band and describe research focusing on the correlation between size dependent and...
Diffraction Line Profiles in the Rietveld Method
2020年8月21日 · PXRD pattern of line profile standard SRM660c (LaB 6), a = 4.156826(8) Å, collected with a benchtop powder diffractometer (Bruker D2 Phaser), using Ni-filtered CuKα radiation produced at 30 kV, 10 mA, and a LynxEye strip detector.
This Standard Reference Material (SRM) is intended for use as a standard for calibration of diffraction line positions and line shapes determined through powder diffractometry. A unit of SRM 660a consists of approximately 6 g of lanthanum hexaboride powder bottled under argon.
X-ray diffraction (XRD) pattern of LaB6 nanostructures
High-quality, uniform, one-dimensional (1D) lanthanum hexaboride (LaB6) nanostructures with different morphologies (for example, sparse or dense nanoneedles, or nanorods and nanowire arrays) were...
Standard Reference Material 660b for X-ray Metrology
2010年8月1日 · It consists of approximately 6 g LaB6 powder prepared using 11B isotopically enriched precursor material so as to render the SRM relevant to the neutron diffraction community.
Tutorial on Powder X-ray Diffraction for Characterizing Nanoscale ...
2019年7月23日 · Powder X-ray diffraction (XRD) is a common characterization technique for nanoscale materials. Analysis of a sample by powder XRD provides important information that is complementary to various microscopic and spectroscopic methods, such as phase identification, sample purity, crystallite size, and, in some cases, morphology.
Lecture 2.7. Powder X-Ray Diffraction (PXRD) - Dr. M. Aslam
• Standards: – Si, LaB6, Ni, ZnO, TiO2, CeO2, Al2O3, Cr2O3, and Y2O3. • Samples can be used as calibrants: – X-ray and neutron powder diffraction 11 • The National Institute of Standards and Technology (NIST) supplies standard calibrating materials for many applications.
Using LaB6 as an instrumental broadening standard with a Cauchy FWHM of 0.133o, the cor rected FWHM is 0.167o, and the Scherrer equation gives a crystallite size of 512 Å. The spotty diffraction ring is due to the large crystallites compared to the sampling volume (beam size).