2019年10月9日 · Two methods—attenuated total reflection Fourier infrared spectroscopy (ATR-FTIR) and X-ray photoelectron spectroscopy (XPS)—have been used to analyze the chemical structure of polytetrafluorethylene (PTFE) thin coatings deposited by pulsed laser (PLD) and pulsed electron beam (PED) ablations.

1996年4月1日 · We report x-ray photoemission spectra of poly (tetrafluoroethylene) (PTFE). XPS spectra were measured with the SSI, SSX-100 model, using monochromated Al Kα x-rays. We present the survey spectrum (binding energy range of 0–1000 eV) and narrow scans of C …

2024年5月15日 · X-ray photoelectron spectroscopy (XPS) measurements and ab-initio calculations of the XPS chemical shift were performed to identify chemical species on plasma-treated polytetrafluoroethylene (PTFE) surfaces. The obtained C1s-XPS and O1s-XPS spectra confirmed the generation of oxygen-containing functional groups on …

1996年4月1日 · We report x-ray photoemission spectra of poly (tetrafluoroethylene) (PTFE). XPS spectra were measured with the SSI, SSX-100 model, using monochromated Al Kα x-rays. We present the survey spectrum (binding energy range of 0–1000 eV) and narrow scans of C …

2019年10月9日 · Two methods—attenuated total reflection Fourier infrared spectroscopy (ATR-FTIR) and X-ray photoelectron spectroscopy (XPS)—have been used to analyze the chemical structure of...

X-ray induced photoelectron spectroscopy (XPS) in combination with depth profiling has been used to investigate the structure and the degradation mechanism of PTFE bonded gas diffusion electrodes (GDE). The XP-spectra of these electrodes show distinctly separated binding states of the C1s electrons at E b =292 eV and E b =286 eV.

We report x-ray photoemission spectra of poly (tetrafluoroethylene) (PTFE). XPS spectra were measured with the SSI, SSX-100 model, using monochromated Al Kα x-rays. We present the survey spectrum (binding energy range of 0–1000 eV) and narrow scans of C 1s and F 1s.

Two methods—attenuated total reflection Fourier infrared spectroscopy (ATR-FTIR) and X-ray photoelectron spectroscopy (XPS)—have been used to analyze the chemical structure of polytetrafluorethylene (PTFE) thin coatings deposited by pulsed laser (PLD) and pulsed electron beam (PED) ablations.

摘要： Yasuda等 [1] 在用XPS研究离子体处理后的PTFE表面结构时,得到一个包络的C 1s 峰。 本文对此进行探讨。

2019年10月12日 · Two methods-attenuated total reflection Fourier infrared spectroscopy (ATR-FTIR) and X-ray photoelectron spectroscopy (XPS)-have been used to analyze the chemical structure of polytetrafluorethylene (PTFE) thin coatings deposited by pulsed laser (PLD) and pulsed electron beam (PED) ablations.