TEM characterisation of PZT films prepared by a diol route on ...
2000年8月1日 · PZT (65/35) films were prepared using a diol route with 10 mol% excess Pb and deposited on Pt/Ti/SiO 2 /Si substrates. Samples were characterised using XRD and cross …
Structural characteristics and crystalline nature of PZT powders ...
2024年10月25日 · Transmission electron microscopy (TEM) analyses unveiled that TZO possesses a single-crystal structure with the axial direction along the [010] crystallographic …
In situ TEM observations of microstructural characteristics of …
2017年12月15日 · The microstructural characteristics of lead zirconate titanate (PZT) ceramic at high temperature were examined by in situ transmission electron microscopy (TEM) …
TEM of PZT alumina membrane: (a)—dark field image of …
In this paper we report a detailed structural and optical characterization of PZT nanorods fabricated by templating into porous alumina membranes (of 200 nm pore diameter).
TEM Characterization of Single‐ and Multilayer Triol‐Based Sol–Gel PZT ...
2008年7月7日 · Crack-free single-layer PZT films of up to 200 nm thick were prepared by triol-based sol–gel processing onto Pt/Ti/SiO 2 /Si substrates. Films ∼75 nm thick exhibited a …
锆钛酸铅压电陶瓷加热至 1000°C 微观结构特征的 TEM 原位观 …
2017年12月1日 · 摘要 通过原位透射电子显微镜 (TEM) 观察晶格和微观结构形成，研究了高温下锆钛酸铅 (PZT) 陶瓷的微观结构特征。 使用 TEM 内的紧凑型加热装置将 PZT 陶瓷从室温加热 …
了解热稳定高性能压电的机理,Acta Materialia - X-MOL
与施主掺杂的 pzt 相比，受主掺杂的商用 pzt 表现出更好的热稳定性。 此外，我们的原位 TEM 表明，与热稳定的高性能压电相对应的是热稳定的精细微结构（即没有退化）。
PbZrxTi.1¡x/O3 (PZT) is utilized in most applications because it has a large remanent polarization, high piezo- and pyroelectric coefficients and optimized …
纳米结构PZT铁电膜的制备及其表征 - cnpowder.com.cn
2025年3月7日 · 剖面透射电镜(tem)像表明pzt纳米铁电膜与底电极(金属纳米线)直接相接触,它们之间的界面呈现一定程度的弯曲。 在PZT纳米铁电薄膜后退火处理后,发现部分Au金属纳米线顶 …
Atomic-scale mechanisms of ferroelastic domain-wall-mediated
2013年11月21日 · Here we present the first real-time, atomic-scale observations and phase-field simulations of domain switching dominated by pre-existing, but immobile, ferroelastic domains …
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