Quanta™ 650 FEG Discover the “any sample, all data” solution for ultimate versatility and high resolution SEM Addressing the need to investigate a wide variety of materials and characterize structure and composition, the FEI Quanta FEG provides unmatched flexibility to increase both

QuantaTM 650 FEG 查看真正的高分辨率多功能扫描电子显微镜 (SEM) 具有何种功能 FEI QuantaTM 可用于研究各种材料并表征材料的结构与成分，同时提供无与伦比 的灵活性，提高了性能与通用性，可应对当今广泛研究领域的各种挑战，满足多 方需要。

Quanta 50 FEG系列是基于前两代成功的肖特基场发射环境扫描技术开发的第三代Quanta系列产品。 这一系列产品用户界面使用起来十分方便、灵活，有多种功能zui*程度地发挥其使用效率，并且允许采集所有需要的数据。

Quanta 650 Features: High resolution Schottky field emission; SEM column optimized for high brightness/high current; High vacuum imaging with beam deceleration up to 4 kV: Landing energy: 200 V to 30 kV; Imaging resolution in high vacuum mode at 30 kV: 0.8 nm (STEM), 1.0 nm (SE), 2.5 nm (BSE) Wet STEM stage for viewing TEM samples/ ESEM samples

The FEI Quanta 650 FEG scanning electron microscope (SEM) is used for high-resolution imaging and semi-quantitative X-ray microanalysis of both conductive and non-conductive specimens at nanometer resolution (magnification range from 5-1,000,000x).

Purpose –The FEI Quanta FEG 650 scanning electron microscope is a variable pressure microscope capable of resolving features at a scale of ~5 nm on samples up to 6-inch in size. The SEM is equipped with 8 detectors for imaging and analysis. This document describes important information and basic operation procedure for imaging.

Quanta 50 FEG系列是基于前两代成功的肖特基场发射环境扫描技术开发的第三代Quanta系列产品。 这一系列产品用户界面使用起来十分方便、灵活，有多种功能最大程度地发挥其使用效率，并且允许采集所有需要的数据。

The FEI Quanta 650 FEG SEM (Scanning Electron Microscope) is a variable pressure microscope used for high resolution imaging. It is capable of resolving features on a scale of less than 5 nm. It is equipped with a Field Emission Gun (FEG) which allows for bright-field and dark-field sample imaging.

FEI Quanta 650 ESEMFEI Quanta 650 SEM features three imaging modes- high vacuum, low vacuum, and environmental SEM (ESEM), which enables charge-free imaging, and microanalysis of non-conductive specimens without preparation. Chemical analysis is available thanks to the equipped Bruker EDX system.

With the Q650 the benefits that come from a FEG source are combined with a large chamber for insitu experiments (both mechanical testing, and heating), numerous electron detectors (SE, in-column SE, solid state BSE, scintillator BSE), and elemental and crystallographic analysis (Oxford AZtec EDS and EBSD).