
X-ray powder diffraction analysis of a silicon carbide-based …
2001年6月1日 · Accurate X-ray powder diffraction (XRD) analysis of SiC-based ceramics is a difficult task due to the significant overlap of the Bragg reflections from the different SiC …
XRD pattern of the 4H-SiC wafer. | Download Scientific Diagram
To provide experimental evidence of this structural feature, synchrotron X‐ray sources are used to obtain X‐ray diffraction (XRD) patterns of polyhedral cuprous oxide crystals.
X-ray diffraction (XRD) patterns of the silicon carbide (SiC) powder ...
The particle size, the stability of suspensions, phase composition, and microstructure of Cu powders were characterized by laser particle size analyzer, zeta potential, X-ray diffraction …
XPS and XRD study of crystalline 3C-SiC grown by sublimation method
1999年5月5日 · The XRD data proved a dominant 3C-SiC structure accompanied by an admixture of the residual 6H-SiC phase. The main core-level photoelectron spectra were analysed in …
X-ray diffraction (XRD) patterns of the 3C-SiC deposit
Highly-oriented polycrystal 3C-SiC bulks were ultra-fast fabricated via halide chemical vapor deposition (CVD) using tetrachlorosilane (SiCl4) and methane (CH4) as precursors. The …
SiC单晶及其Si异 质外延的X射线衍射分析 - 豆丁网
2015年3月1日 · 上外延了3C—SiC薄膜,利用XRD研究了生长温度、晶格失配、碳化等实验条件对薄膜 取向、应力以及结晶品质的影响;廖燕平等人‘91制备了激光晶化多晶硅薄膜,研究了
simulation results to the XRD data indicates that the B-SiC particles consist either of heavily faulted clusters distrib uted irregularly between regions that have only occasional
Thermal Expansion of 3C-SiC Obtained from In-Situ X-ray ... - MDPI
2022年9月8日 · In situ X-ray crystallography powder diffraction studies on beta silicon carbide (3C-SiC) in the temperature range 25–800 °C at the maximum peak (111) are reported. At 25 …
High‐Quality and Wafer‐Scale Cubic Silicon Carbide Single Crystals
Cubic silicon carbide (3C-SiC) has superior mobility and thermal conduction over that of widely applied hexagonal 4H-SiC. Moreover, much lower concentration of interfacial traps between …
X-ray powder diffraction analysis of a silicon carbide-based …
2001年6月1日 · Accurate X-ray powder diffraction (XRD) analysis of SiC-based ceramics is a difficult task due to the significant overlap of the Bragg reflections from the different SiC …