2024年6月1日 · In this paper, we report synchrotron X-ray photoelectron spectroscopy (XPS) studies of a SnO 2-x /Sn:SiO 2-x composite layer treated with Ar ions etching and the presence of a shift in the core level spectra due to significant surface charging as a result of the conductive/insulating nature of the constituent elements of the composite layer.

The high-resolution deconvoluted XPS spectra for Sn3d are shown in Fig. 6(b). Two Sn 4+ peaks with binding energies of 487.11 (Sn3d5/2) and 495.19 eV (Sn3d3/2) are observed.

2021年12月1日 · Based on the XPS analysis we propose a plausible suppression mechanism of Sn +2 /Sn +4 oxidation, in which the presence of Sn QDs can effectively reduce the defect density but keep the Sn 2+ concertation constant in active layer.

Sn3O4 are promising semiconductor materials due to their visible light absorption ability. In this work, a series of materials, such as SnO2, Sn3O4 and Sn3O4/SnO2 heterostructures, with different...

低辐射镀膜玻璃的 x 射线光电子能谱 (xps) 表征分析; 返回元素表

2016年3月30日 · X-ray photoelectron (XPS) Sn 3d core-level spectra for the as-is Sn-ion implanted a-SiO 2 host, implanted and thermally treated at 900 °C (1 h), and external XPS standards – SnO 2 (Sn 4+) and Sn-metal (Sn 0).

1993年1月1日 · In this work, x-ray photoelectron spectroscopy has been used to obtain comparison spectra of a SnO powder. The SnO powder was generated by grinding ~150 μ m granules of SnO in a mortar and pestle. Grinding is necessary because surface oxidation of the SnO granules occurs producing a SnO 2 shell.

From Figure 7A, we can see the XPS spectrum of O1s electrons as a function of annealing temperature. It can be seen from the figure that the O1s peak is divided into two independent peaks ( Reddy...

发现Sn（IV）的XPS峰位于497.8eV、487.8eV。 一般文献中Sn（IV）峰位在487.6，495.7eV。 请教大家怎样解释？

2024年12月15日 · xps可用于定性分析以及半定量分析, 一般从xps图谱的峰位和峰形获得样品表面元素成分、化学态和分子结构等信息，从峰强可获得样品表面元素含量或浓度（不常用）。